Mueller matrix microscopy on a <i>Morpho</i> butterfly

Arteaga, Oriol; Kuntman, Ertan; Antó, Joan; Pascual, E.; Canillas, A.; Bertrán, E.

doi:10.1088/1742-6596/605/1/012008

Cited by 8 publications

(4 citation statements)

References 8 publications

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“…Imaging Mueller matrix measurements with microscopic resolution have been obtained with a custom made instrument . This Mueller matrix microscope was coupled to a monochromator for spectroscopic Mueller matrix imaging measurements.…”

Section: Methodsmentioning

confidence: 99%

“…In the following, we discuss the polymorph formation and anisotropic texture within thin films controlled by the solution and vapour‐based processing conditions. Thereby, we focus on the local polymorph specific excitonic coupling on a microscopic scale and attempt to capture the anisotropic chiroptical response by imaging Mueller matrix polarimetry …”

Section: Introductionmentioning

confidence: 99%

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Polymorphic chiral squaraine crystallites in textured thin films

et al. 2020

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An enantiomerically pure (R)-2-methylpyrrolidine-based anilino squaraine crystallizes in two chiral polymorphs adopting a monoclinic C2 and an orthorhombic P2 1 2 1 2 1 structure, respectively. By various thin-film preparation techniques, a control of the polymorph formation is targeted. The local texture of the resulting textured thin films is connected to the corresponding optical properties. Special attention is paid to an unusual Davydov splitting, the anisotropic chiroptical response arising from preferred out-of-plane orientation of the crystallites, and the impact of the polymorph specific excitonic coupling. K E Y W O R D Scircular dichroism, Davydov splitting, imaging Mueller matrix polarimetry, polarized spectromicroscopy, X-ray diffraction

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Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Polymorphic chiral squaraine crystallites in textured thin films

et al. 2020

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“…Mueller matrix of a material depends on the scattering geometry and the probing wavelength. [5][6][7][8][9][10][11][12][13][14][15][16] Mueller matrices have been widely used in studying linear scattering process. [17][18][19][20][21] Utility of Mueller matrix measurement has found wide applications in biophotonics, remote sensing, radar polarimetry, and understanding di®erent optical systems.…”

Section: Introductionmentioning

confidence: 99%

Generalized Stokes vector for three photon process

Shaji

Ismail

Satyanarayana

et al. 2017

J. Nonlinear Optic. Phys. Mat.

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Stokes Mueller formalism is used to measure the optical properties of materials by probing the sensitive changes in the polarization state of light after scattering from the medium. The formalism can be extended to nonlinear scattering processes involving two and three photon processes also. In this paper, we derive the Stokes vector, viz. triple Stokes vector analytically from quantum theory of light for a three photon process. The state of polarization of light, with three simultaneous photons, incident on a material is described by triple Stokes vector, and has 16 components involving cubes of intensities dependence. The response of a material for the scattered light in a three photon process is described by 4 × 16 Mueller matrix. Polarization in Polarization out (PIPO) experiments can be carried out to determine the elements of Mueller matrix. We identify 16 independent points on Poincare sphere and construct triple Stokes vector for each point. Four measurements are done to determine the linear Stokes vector of scattered light, where the 16 polarization states are represented by triple Stokes vector and this determines the Mueller matrix of the sample.

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“…The small-scaled texture of crystalline domains in polycrystalline materials impedes full acquisition of the dielectric tensor by global ellipsometric approaches . Imaging Mueller matrix ellipsometry − combines the power of variable angle spectroscopic ellipsometry − and optical microscopy mapping to obtain the complete complex dielectric tensor of microtextured biaxial anisotropic thin film samples from even a single crystallographic orientation.…”

mentioning

confidence: 99%

Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry

Funke¹,

Duwe²,

Balzer

et al. 2021

J. Phys. Chem. Lett.

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Polycrystalline textured thin films with distinct pleochroism and birefringence comprising oriented rotational domains of the orthorhombic polymorph of an anilino squaraine with isobutyl side chains (SQIB) are analyzed by imaging Mueller matrix ellipsometry to obtain the biaxial dielectric tensor. Simultaneous fitting of transmission and oblique incidence reflection Mueller matrix scans combined with the spatial resolution of an optical microscope allows to accurately determine the full biaxial dielectric tensor from a single crystallographic sample orientation. Oscillator dispersion relations model well the dielectric tensor components. Strong intermolecular interactions cause the real permittivity for all three directions to become strongly negative near the excitonic resonances, which is appealing for nanophotonic applications.

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Mueller matrix microscopy on a Morpho butterfly

Cited by 8 publications

References 8 publications

Polymorphic chiral squaraine crystallites in textured thin films

Polymorphic chiral squaraine crystallites in textured thin films

Generalized Stokes vector for three photon process

Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry

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