2011
DOI: 10.1017/s1431927611003163
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Movie Mode Dynamic Transmission Electron Microscopy (DTEM): Multiple Frame Movies of Transient States in Materials with Nanosecond Time Resolution

Abstract: The ability to acquire high time resolution movies, dubbed Movie Mode Dynamic Transmission Electron Microscope (DTEM), expands the DTEM's science capabilities in single-shot mode by providing detailed histories of unique material events on the nanometer and nanosecond scale. Prior DTEM hardware only allowed single-pump/single-probe operation, building up a process's typical time history by repeating an experiment with varying time delays at different sample locations [1,2]. The Movie Mode DTEM upgrade enables … Show more

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Cited by 8 publications
(2 citation statements)
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“…To minimize or effectively reduce the detrimental electron exposures, an electrostatic electron deflector can be added as an additional hardware in STEM. The electrostatic electron deflector can be synchronously operated with the random sparse-scan to deflect the electron beam out from the optic axis of the STEM instrument as demonstrated by Reed et al for the movie-mode dynamic TEM (DTEM) [33]. Second, both hardware and software of the widely used conventional STEMs are optimized for a line-byline or a pixel-by-pixel scan (i.e.…”
Section: Resultsmentioning
confidence: 99%
“…To minimize or effectively reduce the detrimental electron exposures, an electrostatic electron deflector can be added as an additional hardware in STEM. The electrostatic electron deflector can be synchronously operated with the random sparse-scan to deflect the electron beam out from the optic axis of the STEM instrument as demonstrated by Reed et al for the movie-mode dynamic TEM (DTEM) [33]. Second, both hardware and software of the widely used conventional STEMs are optimized for a line-byline or a pixel-by-pixel scan (i.e.…”
Section: Resultsmentioning
confidence: 99%
“…A similar scheme has been introduced in electron scattering machines in the movie mode dynamic transmission electron microscope (DTEM) 10 where an arbitrary laser waveform generator and two deflecting plates were used to project up to 16 different snapshots of a process in different regions of the detector screen. Here, we explore the possibility of applying this technique to MeV UED and ultrafast electron microscopy (UEM) with radiofrequency photoinjectors, which offer significant advantages in the suppression of space charge forces and penetration depth, among others.…”
Section: Introductionmentioning
confidence: 99%