25th European Mask and Lithography Conference 2009
DOI: 10.1117/12.835202
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Mounting methodologies to measure EUV reticle nonflatness

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“…The calculated deformation can then be subtracted from the measured flatness error to yield the unconstrained flatness error. This approach was taken by Battula et al [5], who have modeled the deformation of EUVL substrates with FEA and then sought to verify the models using different substrate mounts. It appears that the chief problem of the modeling approach lies in the difficulty of verifying the numerical model as long as the unconstrained flatness error of the mask substrate cannot be measured.…”
Section: Introductionmentioning
confidence: 99%
“…The calculated deformation can then be subtracted from the measured flatness error to yield the unconstrained flatness error. This approach was taken by Battula et al [5], who have modeled the deformation of EUVL substrates with FEA and then sought to verify the models using different substrate mounts. It appears that the chief problem of the modeling approach lies in the difficulty of verifying the numerical model as long as the unconstrained flatness error of the mask substrate cannot be measured.…”
Section: Introductionmentioning
confidence: 99%