Abstract:This study introduced a new design of a low-cost customized A-scan Non Destructive Testing (NDT) unit using microcontroller-based scanning motion. the scanning unit from previous research has limitations in scanning envelope area and ability of detection. It can only detect large defects. To solve the limitations mentioned above, the purpose of this study is to develop a device with lower cost, more appropriate size of scanning envelop area, and ability to detect internal layer defections. the mechanism of thi… Show more
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