Morphotropic phase boundary in Sm-substituted BiFeO3 ceramics: Local vs microscopic approaches

Pakalniškis, Andrius; Skaudžius, Ramūnas; Zhaludkevich, D.V.; Zhaludkevich, A. L.; Аликин, Д. О.; Abramov, A. S.; Murauskas, Tomas; Shur, V. Ya.; Dronov, Alexey; Silibin, Maxim V.; Selskis, Algirdas; Ramanauskas, R.; Łukowiak, Anna; Stręk, W.; Karpinsky, D. V.; Kareiva, Aivaras

doi:10.1016/j.jallcom.2021.159994

Cited by 11 publications

(2 citation statements)

References 48 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…However, in contrast to the success in studying polycrystalline electroceramics [26][27][28], there are limitations of BLM to extract reliable information about electrical conductivity and dielectric permittivity due to GB in very thin films. The Sm substitution effects on the dielectric permittivity, remnant polarization, leakage current, domain structure, local switching, microscopic approaches, and other physical properties of BSFO ceramics [29][30][31], nanoparticles [13], and thin films [32] have been reported in the literature. Although these results, it lacks a systematic study using the BLM to fit experimental data and extract useful information on the physical properties of BSFO thin films.…”

Section: Introductionmentioning

confidence: 99%

Charge transport and dielectric characteristics of Sm _x Bi_1−xFeO₃ thin films from the perspective of grain and grain boundary properties

Minussi

Borges

Araújo

2023

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

Samarium-substituted bismuth ferrite (SmxBi1-xFeO3) compositions comprise a system of important materials due to their combination of multiferroic properties. Several dielectric and charge transport reports in literature can be found in this system. However, as a typical polycrystalline electroceramic, their grains and grain boundaries (GBs) are expected to possess very different properties. To this date, these distinctions have not been performed on this system. In this work, through measurements via impedance spectroscopy on SmxBi1-xFeO3 thin films, we show that using a brick layer model allows the separation of the electrical properties of grains and GBs. Results indicate that grains have dielectric permittivity and electrical conductivity much higher than GBs. Their properties mostly control the characteristics observed in the studied thin films. The introduction of samarium reduces the electrical conductivity and increases the activation energies for charge transport in grains and GBs. In turn, dielectric permittivity is reduced in grains and subtly increased in GBs

show abstract

Section: Introductionmentioning

confidence: 99%

Charge transport and dielectric characteristics of Sm _x Bi_1−xFeO₃ thin films from the perspective of grain and grain boundary properties

Minussi

Borges

Araújo

2023

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

show abstract

“…An especially interesting application of SbSI nanowires as well as of other piezoelectric materials as BaTiO 3 (BTO) [ 44 , 45 , 46 , 47 , 48 , 49 ], BiFeO 3 (BFO) [ 50 , 51 , 52 , 53 ], K 0.5 Na 0.5 NbO 3 (KNNO) [ 54 , 55 , 56 ], AlN [ 57 ], and PLZT-based (Pb 1-x La x Zr y Ti 1-y O 3 ) ceramic [ 58 , 59 , 60 , 61 ] are the strain sensors in FRP, due to wide range of its applications in industry. However, proper design of piezoelectric integrated sensors in FRP requires precise interpretation of generated signal and its correlation with structure deformation.…”

Section: Introductionmentioning

confidence: 99%

X-ray Diffraction and Piezoelectric Studies during Tensile Stress on Epoxy/SbSI Nanocomposite

Godzierz

Toroń

Szperlich

et al. 2022

Sensors

View full text Add to dashboard Cite

In this paper, the performance of epoxy/SbSI nanocomposite under tensile stress was investigated. X-ray diffraction studies show the main stress mode has shear nature in the case of elastic deformation, while a combination of shear and tensile stress during plastic deformation caused lattice deformation of SbSI and shift of sulfur atoms along the c axis of the unit cell. Apart from that, the piezoelectric signals were recorded during tensile tests. Epoxy/SbSI nanocomposite responded to the applied tensile stress by generating a piezoelectric current with a relatively high value. The measured piezoelectric peak-to-peak current is relatively high (Ip-p = 1 pA) in comparison to the current flowing through the sample (8.16 pA) under an applied voltage of 100 V. The current level is independent of the deformation speed rate in contradistinction to complex stress states. The signal comes from the whole volume of the sample between electrodes and is generated by shear stress.

show abstract

Effect of substrate orientation on the structures and properties of BiFe0.91Zr0.09O3 thin films

Liu,

Ma,

Jiang

et al. 2024

J Mater Sci: Mater Electron

View full text Add to dashboard Cite

Morphotropic phase boundary in Sm-substituted BiFeO3 ceramics: Local vs microscopic approaches

Cited by 11 publications

References 48 publications

Charge transport and dielectric characteristics of Sm _x Bi_1−xFeO₃ thin films from the perspective of grain and grain boundary properties

Charge transport and dielectric characteristics of Sm _x Bi_1−xFeO₃ thin films from the perspective of grain and grain boundary properties

X-ray Diffraction and Piezoelectric Studies during Tensile Stress on Epoxy/SbSI Nanocomposite

Effect of substrate orientation on the structures and properties of BiFe0.91Zr0.09O3 thin films

Contact Info

Product

Resources

About

Morphotropic phase boundary in Sm-substituted BiFeO3 ceramics: Local vs microscopic approaches

Cited by 11 publications

References 48 publications

Charge transport and dielectric characteristics of Sm x Bi1−x FeO3 thin films from the perspective of grain and grain boundary properties

Charge transport and dielectric characteristics of Sm x Bi1−x FeO3 thin films from the perspective of grain and grain boundary properties

X-ray Diffraction and Piezoelectric Studies during Tensile Stress on Epoxy/SbSI Nanocomposite

Effect of substrate orientation on the structures and properties of BiFe0.91Zr0.09O3 thin films

Contact Info

Product

Resources

About

Charge transport and dielectric characteristics of Sm _x Bi_1−xFeO₃ thin films from the perspective of grain and grain boundary properties

Charge transport and dielectric characteristics of Sm _x Bi_1−xFeO₃ thin films from the perspective of grain and grain boundary properties