“…9,15,30,31 Recently, x-ray diffractometry revealed significant modifications on the crystallographic structure and morphology at the surface upon anodization at 500 mV versus Ag/AgCl for just 1 min. 32 In particular, a significant grain growth at the surface by a 3 factor of magnitude was observed. Microstructure, in particular the crystallinity, crystallite size, shape, spatial distribution, and morphology have an important influence on electrical, optical, and catalytic properties of semiconductor materials.…”