Morphology of thin silver film grown by dc sputtering on Si(001)

Kundu, Sourav; Hazra, S.; Banerjee, Gaurab; Sanyal, M. K.; Mandal, Subhra; Chaudhuri, S.; Pal, A.K.

doi:10.1088/0022-3727/31/23/001

Cited by 89 publications

(42 citation statements)

References 20 publications

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“…Figure 3 shows AFM images of CdTe thin films deposited at different deposition times. The films surface are formed by small rounded grains; observed for most of the sputtered materials [21,22]. The roughness of the films deposited at different deposition times are given in Table 1.…”

Section: Resultsmentioning

confidence: 99%

Effects of various deposition times and RF powers on CdTe thin film growth using magnetron sputtering

2016

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Cadmium telluride (CdTe) is a p-type II-VI compound semiconductor, which is an active component for producing photovoltaic solar cells in the form of thin films, due to its desirable physical properties. In this study, CdTe film was deposited using the radio frequency (RF) magnetron sputtering system onto a glass substrate. To improve the properties of the CdTe film, effects of two experimental parameters of deposition time and RF power were investigated on the physical properties of the CdTe films. X-ray Diffraction (XRD), atomic force microscopy (AFM) and spectrophotometer were used to study the structural, morphological and optical properties of the CdTe samples grown at different experimental conditions, respectively. Our results suggest that film properties strongly depend on the experimental parameters and by optimizing these parameters, it is possible to tune the desired structural, morphological and optical properties. From XRD data, it is found that increasing the deposition time and RF power leads to increasing the crystallinity as well as the crystal sizes of the grown film, and all the films represent zinc blende cubic structure. Roughness values given from AFM images suggest increasing the roughness of the CdTe films by increasing the RF power and deposition times. Finally, optical investigations reveal increasing the film band gaps by increasing the RF power and the deposition time.

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Section: Resultsmentioning

confidence: 99%

Effects of various deposition times and RF powers on CdTe thin film growth using magnetron sputtering

2016

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“…Recently, Yang et al [13] demonstrated that the bimetal Ag-Au NPs far more stable than the pure Ag NPs against oxidation. Ag NPs are prepared by various wet chemistry methods [14,15], vacuum deposition techniques (VDT) which includes thermal evaporation [16], sputtering [17] and pulsed laser deposition [18] etc. Amongst, VDT is advantageous over wet chemistry routes because it can directly be used for the above mentioned applications before going for any surplus process.…”

Section: Introductionmentioning

confidence: 99%

Structural, morphological and optical properties of Ag–AgO thin films with the effect of increasing film thickness and annealing temperature

Pal

Mohan

2015

Optical Materials

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“…The results clearly indicate the formation of ellipsoidal islands. The morphology of these islands could be extracted from these complementary measurements [36]. STS measurements of these islands having different density profiles show the opening of a "band-gap" in the Au clusters as cluster-size is reduced [37].…”

Section: Metal Filmsmentioning

confidence: 99%

“…These studies are important to understand not only the growth mechanisms [17,20,24,28,36,42,45] of these materials but also the unusual properties of nanomaterials such as continuous melting process [19,64,65], negative thermal expansion [66], and semiconductorlike transport properties of metals [2,35,37,38].…”

Section: Nanocomposite Filmsmentioning

confidence: 99%

Morphology of nanostructured materials

Sanyal

Datta

Hazra

2002

Pure and Applied Chemistry

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Here we shall discuss the importance of grazing incidence X-ray scattering techniques in studying morphology of nanostructured materials confined in thin films and multilayers. In these studies, the shapes, sizes, and structures of nanostructured materials and their distribution in composites are investigated. These studies are important for understanding properties that may deviate considerably from the known bulk properties. We shall first outline basics of three X-ray scattering techniques, namely X-ray reflectivity, grazing incidence small-angle X-ray scattering, and grazing incidence diffraction, used for these studies. We shall then demonstrate the utility of these techniques using some known results.

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Morphology of thin silver film grown by dc sputtering on Si(001)

Cited by 89 publications

References 20 publications

Effects of various deposition times and RF powers on CdTe thin film growth using magnetron sputtering

Effects of various deposition times and RF powers on CdTe thin film growth using magnetron sputtering

Structural, morphological and optical properties of Ag–AgO thin films with the effect of increasing film thickness and annealing temperature

Morphology of nanostructured materials

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