2006
DOI: 10.1016/j.photonics.2005.11.003
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Morphology of periodic nanostructures for photonic crystals grown by glancing angle deposition

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Cited by 41 publications
(18 citation statements)
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“…In general, these microstructures are caused by the shadowing of the deposition flux when arriving at the growing film, which makes tall surface features prevent the deposition under their shadow. This produces a competitive growth among surface motives, which ends up in the development of tilted structures oriented towards the incoming deposition flux [6][7][8][9][10][11][12][13][14][15][16][17][18][19]. The use of these thin films as a host for the development of nanostructured composite materials is another potential application quite dependent on the final topology of the films that has been widely investigated by our group [20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%
“…In general, these microstructures are caused by the shadowing of the deposition flux when arriving at the growing film, which makes tall surface features prevent the deposition under their shadow. This produces a competitive growth among surface motives, which ends up in the development of tilted structures oriented towards the incoming deposition flux [6][7][8][9][10][11][12][13][14][15][16][17][18][19]. The use of these thin films as a host for the development of nanostructured composite materials is another potential application quite dependent on the final topology of the films that has been widely investigated by our group [20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%
“…If electron beam lithography (EBL) is used to pattern templates for subsequent GLAD growth, most research work so far concentrated on dot-like seeds forming tetragonal arrays with specific periods d (center-to-center distance of nearest neighbors) [9][10][11][12][13][14][15]. Besides tetragonal lattices, other seed arrangements have been applied for GLAD as well, for instance triangular lattices [16], or quasi-one-dimensional line arrays, realized with photoresist lines on a substrate [17].…”
mentioning
confidence: 99%
“…Deposition pressures were typically below 10 -6 Torr . To further reduce column broadening, the phi-sweep method was used [9]; phi-sweep parameters were 12 nm sections with a 5 nm transition for a total pitch of 29 nm. Fig.…”
Section: Optical Characterizationmentioning
confidence: 99%