2013
DOI: 10.1021/la304915j
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Morphology Control in Mesoporous Carbon Films Using Solvent Vapor Annealing

Abstract: Ordered mesoporous (2-50 nm) carbon films were fabricated using cooperative self-assembly of a phenolic resin oligomer with a novel block copolymer template (poly(styrene-block-N,N-dimethyl-n-octadecylamine p-styrenesulfonate), (PS-b-PSS-DMODA)) synthesized by reversible addition-fragmentation chain transfer (RAFT) polymerization. Due to the high Tg of the PS segment and the strong interactions between the phenolic resin and the PSS-DMODA, the segmental rearrangement is kinetically hindered relative to the cro… Show more

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Cited by 23 publications
(47 citation statements)
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“…The porosity of non-SVA film is approximately 23% and the porosity increases to 27% when SVA is applied. This increase is attributed to improvements in to the ordered structure that decrease the film contraction during the carbonization, which is consistent with the previous results [31]. However, there is no significant difference in the porosity between the mesoporous carbon films annealed by SVA and SVA-SS (28%).…”
Section: Resultssupporting
confidence: 91%
See 2 more Smart Citations
“…The porosity of non-SVA film is approximately 23% and the porosity increases to 27% when SVA is applied. This increase is attributed to improvements in to the ordered structure that decrease the film contraction during the carbonization, which is consistent with the previous results [31]. However, there is no significant difference in the porosity between the mesoporous carbon films annealed by SVA and SVA-SS (28%).…”
Section: Resultssupporting
confidence: 91%
“…This dynamic nature of the mesostructure in films provides opportunities for improved control of the ordered structure, but the thermal energy that enables ordering of the nanostructure also drives the crosslinking of the resol precursor. This leads to a competition between the crosslinking and ordering kinetics that can limit the quality of the ordered structures [31].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The cell geometry dictated the angle of incidence to be 75°, and a limited wavelength range from 300 to 1150 nm was applied for the recursive fits due to the absorption of solvents in the ultraviolet and near‐infrared light region. Standard window correction protocols with a silicon wafer with thermal oxide (25.0 nm) as the reference were used before each measurement . The ellipsometry data were fitted by applying a four‐layer model consisting of a silicon substrate layer, a fixed 1.0 nm Si–SiO 2 interface layer, a 0.8 nm thermal oxide layer, and a Cauchy layer (with thickness, A and B free fit parameters) in Complete EASE (J.…”
Section: Methodsmentioning
confidence: 99%
“…Sufficient time was allowed for the PDMS to fully wet the BCP films prior to the SVA (∼1 min). Mass flow controllers (MKS‐146C‐FF000–1) were used to control the flow rate of solvent vapor and dry air as previously reported . To align the nanostructure, the BCP films were first annealed by nearly saturated THF solvent vapor at 800 mL/min for 3 h and subsequently dried by flowing dry air at 250 mL/min for 20 min.…”
Section: Methodsmentioning
confidence: 99%