2016
DOI: 10.1016/j.apsusc.2016.06.076
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Morphology and stress at silicon-glass interface in anodic bonding

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Cited by 19 publications
(7 citation statements)
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“…With the continuous migration of lithium ions, the width of the cation depletion layer is reached to the maximum, creating a tremendous electrostatic field force between depletion layer and Al foil. Therefore, close contact between PEO‐HBPUEs and Al foil is occurred accompanied by the microcreep and viscous flow, and then the elements are began to diffuse that facilitate the chemical reaction to form the bonding layer 39,40 …”
Section: Resultsmentioning
confidence: 99%
“…With the continuous migration of lithium ions, the width of the cation depletion layer is reached to the maximum, creating a tremendous electrostatic field force between depletion layer and Al foil. Therefore, close contact between PEO‐HBPUEs and Al foil is occurred accompanied by the microcreep and viscous flow, and then the elements are began to diffuse that facilitate the chemical reaction to form the bonding layer 39,40 …”
Section: Resultsmentioning
confidence: 99%
“…For anodic bonding wafer, residual stress caused by differences of thermal expansion coefficient of Si/glass has been sufficiently studied. Both experimental results and FEM simulation show that the stress concentrates on the bonding interface [ 26 ]. Charge transfer is also proven to be a stress implantation process due to Na gradient [ 27 ] and ions replaced [ 28 , 29 ].…”
Section: Resultsmentioning
confidence: 99%
“…The COMPASS III force field was used in the MD simulations. [61] Previous studies utilized the COMPASS force field in both c-Si [62][63][64][65][66] and crystalline silica [67][68][69] systems. The simulated density value of pristine c-Si systems (i.e., 2.331 g cm À3 at 25 °C) and the lattice constants of an 8 Â 8 Â 8 supercell of a Si unit cell (i.e., 43.433 Å at 25 °C) closely match the experimental values (i.e., 2.329 g cm À3 and 43.446 Å for 8 Si unit cells).…”
Section: Methodsmentioning
confidence: 99%