2007
DOI: 10.1007/s11664-007-0148-y
|View full text |Cite
|
Sign up to set email alerts
|

Morphology and Pull Strength of Sn-Ag(-Co) Solder Joint with Copper Pad

Abstract: In order to clarify the effect of the addition of Co to the Sn-Ag solder, the formation and growth of an intermetallic compound (IMC) at the interface between Sn-Ag(-Co) solders and a Cu pad were investigated, and the joint strength of the solder with a Cu pad was also evaluated by a bump pull test. Binary Sn-3.5mass%Ag solder was used as the basic solder, and Sn-3.5mass%Ag-xCo solders (x = 0.1 mass%, 0.3 mass%, and 0.5 mass%) were specially prepared as Co-added solders. For the reflow process, specimens were … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

2
14
0

Year Published

2009
2009
2023
2023

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 24 publications
(16 citation statements)
references
References 21 publications
2
14
0
Order By: Relevance
“…However, the g-Cu 6 Sn 5 phase has a porous structure with solder trapped in the voids when a minor amount of Co is added, as shown in Fig. 3b, c. The reaction phase morphologies are similar to those in the Sn-Ag-(Co)/Cu and Sn-Ag-Cu-(Co)/Cu interfacial reactions, 7,9 in which the g-Cu 6 Sn 5 phase also exhibits a porous morphology in Co-containing reaction couples.…”
Section: Solidificationmentioning
confidence: 72%
See 3 more Smart Citations
“…However, the g-Cu 6 Sn 5 phase has a porous structure with solder trapped in the voids when a minor amount of Co is added, as shown in Fig. 3b, c. The reaction phase morphologies are similar to those in the Sn-Ag-(Co)/Cu and Sn-Ag-Cu-(Co)/Cu interfacial reactions, 7,9 in which the g-Cu 6 Sn 5 phase also exhibits a porous morphology in Co-containing reaction couples.…”
Section: Solidificationmentioning
confidence: 72%
“…However, the e-Cu 3 Sn phase is not observed in the Sn-57 wt.%Bi-0.05 wt.%Co/Cu and Sn-57 wt.%Bi-0.5 wt.%Co/Cu couples aged at 100°C for 1500 h, as shown in Fig. 8b, c. Fe, Co, Ni, and Zn are regarded as effective elements to suppress the growth of the e-Cu 3 Sn phase, 7,9,[27][28][29] and the results mentioned above are in agreement with the literature. Several studies have discussed the suppression of e-Cu 3 Sn phase growth by minor alloying additions.…”
Section: Liquid/solid Interfacial Reactionsmentioning
confidence: 93%
See 2 more Smart Citations
“…As a result, great efforts have been made to develop lead-free and environmentally sound interconnect joining technologies as alternatives to Sn-Pb eutectic soldering technologies. [1][2][3][4][5][6][7] The use of lead-free solder such as the Sn-Ag-Cu system and the Sn-Cu system is advancing throughout the world. Considerable research efforts into the characteristics of lead-free solder are underway to improve lead-free solder technologies.…”
Section: Introductionmentioning
confidence: 99%