Morphology and properties of ZnO films obtained by repeated spin coating on porous silicon substrates

Abstract

⎯Layers of porous silicon (PS), multilayered ZnO films, and heterostructures based on them are obtained. The surface morphology, chemical and phase composition of the PS layers and ZnO films, and the transverse cleavage of ZnO-PS nanocomposite, are investigated via energy-dispersive X-ray spectral analysis (EDX), X-ray diffraction (XRD), and scanning electron microscopy (SEM). The current-voltage characteristics

Microprocessor System for Investigation of Sensor Characteristics on the Basis of Porous Silicon

“…Being transparent in a wide spectral region, ZnO is highly resistant to radiation and is relatively cheap, which makes it attractive for use in microelectronics. A great interest is also the integration of ZnO with silicon technology, which allows combining the unique functionality of these materials when creating photoconverters on silicon substrates and, in particular, in thin-film solids some elements [5]. On the other hand, porous silicon-ZnO composites have been used for white light emission and to tune ZnO grain size for possible sensing applications [6].…”