“…23 A comparative study of the formation and growth of IMC at the interface between Sn-based solders (i.e., Sn-3.5Ag and Sn-3.0Ag-0.5Cu) and Cu with different surface finishes of OSP/Cu, Ni/Cu, and electroless Ni immersion gold (ENIG)/Cu showed that the OSP surface finish promoted interdiffusion between Cu and Sn during soldering, that the composition and morphology of the IMC layer at the solder/Ni/Cu interface were sensitive to the Cu concentration in the solder, and that solder joints with different IMC morphological features exhibited significant differences in shear strength. 25 For two different solder joints of Sn-3.0Ag-0.5Cu/Cu and Sn-3.0Ag-0.5Cu/ENIG, the growth rate of the IMC layer for the Cu substrate was more than three times faster than that for the ENIG substrate. 26 Furthermore, it was reported that, for three different board finishes of commercial Cu, Ag-Cu, and Sn-Cu on FR-4 (Photocircuits), the texture of the board finish did not notably influence the growth rate of the layers, and smoother initial board finishes led to stronger and more reliable solder joints.…”