1999
DOI: 10.1046/j.1439-037x.1999.00251.x
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Morphological Traits Associated with Lodging Resistance of Spring Wheat (Triticum aestivum L.)

Abstract: Throughout the world, lodging in cereals causes great losses in yield each year. A two year field study was conducted to determine the relationship of morphological traits to lodging resistance in spring wheat (Triticum aestivum L.) breeding lines and to find easily measurable traits related to lodging resistance. A set of 15 breeding lines, representing a wide range of combinations of plant height and lodging resistance, was evaluated. During the first year, 29 morphological traits were measured at two growth… Show more

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Cited by 116 publications
(93 citation statements)
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“…Buckling of lower internodes (stem lodging) is commonly observed in wheat, barley, and oats due to differences in the weight and strength of upper and lower internodes of the stem. In common wheat, traits that are most correlated with lodging resistance are: plant height, stem length, stem diameter, stem and spike weight, stem wall thickness, and mechanical layer thickness (Kelbert et al, 2004a,b;Kong et al, 2013;Wang et al, 2006;Zuber et al, 1999). Recent studies investigated the correlations between lodging resistance and the concentrations of cellulose, lignin, pectin, and protein in the stem (Kong et al, 2013;Wang et al, 2012).…”
Section: Discussionmentioning
confidence: 99%
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“…Buckling of lower internodes (stem lodging) is commonly observed in wheat, barley, and oats due to differences in the weight and strength of upper and lower internodes of the stem. In common wheat, traits that are most correlated with lodging resistance are: plant height, stem length, stem diameter, stem and spike weight, stem wall thickness, and mechanical layer thickness (Kelbert et al, 2004a,b;Kong et al, 2013;Wang et al, 2006;Zuber et al, 1999). Recent studies investigated the correlations between lodging resistance and the concentrations of cellulose, lignin, pectin, and protein in the stem (Kong et al, 2013;Wang et al, 2012).…”
Section: Discussionmentioning
confidence: 99%
“…In common wheat, resistance to lodging is highly correlated with plant height as well as stem diameter, stem wall thickness, mechanical layer thickness, and area of transverse section (Kelbert et al, 2004a;Kong et al, 2013;Wang et al, 2006;Zuber et al, 1999). Higher values of the above traits are indicative of increased resistance to lodging.…”
Section: Discussionmentioning
confidence: 99%
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