Morphological, structural, and optical properties of flexible Tin Oxide(II) thin film via thermal evaporation technique

Abstract

Tin oxide compounds have been highly studied due to their important properties. Tin Oxide (II) SnO compound is considered an ideal p-type conductive material, with large p-type carrier mobility. It is getting a lot of attention in next-generation electronic applications. In this work, the SnO thin film was deposited on the polyethylene terephthalate (PET) substrate by the thermal evaporation method. The X-ray diffraction pattern revealed the amorphous structure of the SnO/PET thin film. The purity of the SnO/PET film was confirmed using the Raman spectrum. An atomic force microscope was carried out to investigate the topography (roughness and particle size) of the obtained SnO thin film. The optical band gap $$E_{{\text{g}}}^{{{\text{Opt}}}}$$ E g Opt for SnO/PET thin film in the absorption region was estimated using Tauc’s equation. The refractive index for the SnO/PET thin film was estimated at the normal dispersion range by a single oscillator model. The dielectric optical properties of the SnO/PET thin film were estimated. The calculated third-order nonlinear susceptibility χ(3) and nonlinear refractive index n(2) were in the order of ~ 10−10 and ~ 10−9esu, respectively, within the photon energy range (0.5 to 4 eV). The Sheik–Bahae model was used to determine the nonlinear absorption coefficient βc for SnO/PET thin film. Based on these detailed results, the high nonlinear optical parameters pave the way for the probability of using the SnO/PET in flexible optoelectronics devices. Graphical abstract

A Novel Organic Semiconductor 4-phenylthiazol-2-yl-(phenylhydrazono) acetonitrile (PTPA) Thin Films: Synthesis, Optical and Electrical properties

“…Whereas, films become non-absorbing at longer wavelengths of λ > 500 nm. The linear optical constants, including the refractive index, n, and the extinction coefficient, k, can be calculated from α (λ) and R (λ) as shown in 46,47 :…”

“…NLO parametrs such as third-order nonlinear susceptibility 𝝌(𝟑) , nonlinear refractive index 𝒏(𝟐) and nonlinear absorption coefficient (𝜷 𝒄 ) characterise NLO features. These characteristics may be calculated using the empirical equation based on extended Miller's rule, linear refractive index dispersion, and Sheik-Bahae model46,47,[55][56][57] .5 }…”

Structural and Optical Properties of Nanocrystalline 3-(2-Benzothiazolyl)-7-(diethylamino) Coumarin (C6) Thin Films for Optoelectronic Application

“…The dielectric constant at high frequency L can be calculated by analyzing the refractive index n data as follows. In the transparent region, the relation between the refractive index, n, the high frequency dielectric constant, L , and the wavelength , is given by the relation 46,47 :…”

Effect of the sputtering time on the characteristics of p-SnOx:Na films prepared by the reactive direct current magnetron sputtering method

“…Thời gian gần đây, một số nhóm nghiên cứu đã có khảo sát về sự pha tạp cho màng SnO tuy nhiên kết quả công bố giữa các nhóm vẫn tồn tại các kết luận trái ngược hoặc các tính chất điện quang thu được không như mong đợi. Nhóm tác giả Y. Kim và cộng sự 20 Trong quá trình nghiên cứu và phát triển màng SnO x loại p nhiều phương pháp chế tạo màng đã được sử dụng như bốc bay bằng chùm electron trong chân không cao (electron beam) 22 , bốc bay nhiệt trong chân không cao 23 , lắng đọng lớp nguyên tử 24 , phún xạ magnetron rf 25 , và phún xạ phản ứng magnetron DC 26,27…”