2021
DOI: 10.1016/j.cej.2020.128230
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Morphological characterization of urea derived deposits in SCR systems

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Cited by 13 publications
(10 citation statements)
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“…Specially, small pieces (∼0.5 × 0.5 cm 2 ) of SS electrodes was cut off, secured to the sample table using conductive tape, followed by Au deposition for 60 s with the plasma sputtering method for further observation under low power microscopic view (1000×) and high power microscopic view (5000×). The surface roughness of SS fibers was measured by atomic force microscopy (AFM, AIST-NT, Smart SPM, America), accompanied by the calculation of root mean square roughness (RMSR) by ImageJ for further quantitative analyses of the SS surface roughness . The surface roughness of SS fibers was measured by atomic force microscopy (AFM, AIST-NT, Smart SPM, America) in the dynamic mode, accompanied by the calculation of RMSR by ImageJ for further quantitative analyses of the SS surface roughness.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Specially, small pieces (∼0.5 × 0.5 cm 2 ) of SS electrodes was cut off, secured to the sample table using conductive tape, followed by Au deposition for 60 s with the plasma sputtering method for further observation under low power microscopic view (1000×) and high power microscopic view (5000×). The surface roughness of SS fibers was measured by atomic force microscopy (AFM, AIST-NT, Smart SPM, America), accompanied by the calculation of root mean square roughness (RMSR) by ImageJ for further quantitative analyses of the SS surface roughness . The surface roughness of SS fibers was measured by atomic force microscopy (AFM, AIST-NT, Smart SPM, America) in the dynamic mode, accompanied by the calculation of RMSR by ImageJ for further quantitative analyses of the SS surface roughness.…”
Section: Methodsmentioning
confidence: 99%
“…The surface roughness of SS fibers was measured by atomic force microscopy (AFM, AIST-NT, Smart SPM, America), accompanied by the calculation of root mean square roughness (RMSR) by ImageJ for further quantitative analyses of the SS surface roughness. 22 The surface roughness of SS fibers was measured by atomic force microscopy (AFM, AIST-NT, Smart SPM, America) in the dynamic mode, accompanied by the calculation of RMSR by ImageJ for further quantitative analyses of the SS surface roughness. A silicon cantilever with a spring constant of 6 N/m was used to acquire images.…”
Section: Fabrication and Characterization Of Ss Elec-mentioning
confidence: 99%
“…These processes are prevalent in a wide range of natural and engineered systems, contributing to the formation of diverse surface patterns. Examples include the growth of crystal surfaces [1], the development of thin films [2], the advancement of biological fronts such as bacterial colonies [3], coffee stains, density of birds on a wire [4], sedimentary rock formations [5], the progression of chemical reaction fronts, and DNA walk [6]. The roughening of interfaces is influenced by both deterministic and stochastic factors.…”
Section: Introductionmentioning
confidence: 99%
“…It should be pointed out that because urea water solution has higher evaporation and atomization, it is not easy to form a deposit at a higher gas flow temperature and mass flow rate [19]. In addition, deposit growth can also be observed at the peripheral boundary because urea water solution is transported through capillary structures on the surface or within the deposit [20].…”
Section: Introductionmentioning
confidence: 99%