MORPHOLOGICAL CHARACTERIZATION OF SiC MATERIALS

Chermant, J.L.; Coster, Michel; Moussa, R.

doi:10.1051/jphyscol:1986141

J. Phys. Colloques

1986

DOI: 10.1051/jphyscol:1986141

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MORPHOLOGICAL CHARACTERIZATION OF SiC MATERIALS

J.L. Chermant¹,

Michel Coster²,

R. Moussa³

Abstract: R6sumC-L'analyse quantitative d'images a Ct6 utilisCe pour mesurer les principales caractCristiques morphologiques de quelques nuances de Sic-A1 : caractCristiques granulom6triques, forme et anisotropie des cristaux. L'homo-g6n6it6 de ces cbramiques a CtC Ctudi6e par des m6thodes statistiques.

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