Morphological characteristics and Minkowski functionals of Ag‐DLC thin films

Abstract

Nowadays, there is a great interest in designing and fabricating thin films with unique morphologies to improve the surface properties for various applications. In this regard, atomic force microscopy (AFM) is widely used to investigate the surface morphology of thin films. The high spatial and vertical resolution makes AFM capable of extracting surface micro-roughness information precisely. In this study, Ag-DLC films were deposited on different substrates using the RF-PECVD method. The morphological properties were studied by AFM analysis according to ISO 25178-2: 2012.The results of analyzing the AFM data demonstrate that a copper substrate is a good option for the fabricated silver film in this study, and it is a relatively ideal surface in terms of fractality.

Nanoscale morphology, optical dynamics and gas sensor of porous silicon

“…We delved further into the morphological characteristics of the samples using Minkowski Functionals (MFs) 12 , 13 , and the results are depicted in Fig. 4 .…”

“…However, AFM stands out as a precision tool for comprehensive assessment of a surface's topographical properties 10 , 11 . Due to its sensitivity and accuracy, AFM generates 3D topographic maps, yielding diverse morphological parameters and Minkowski functionals (MFs) 12 , 13 . These insights prove invaluable for characterizing surfaces across various scales.…”

One-Step Sol-Gel Facile Synthesis and 3D Nanoscale Morphology Investigation of Bi0.5Na0.5TiO3-BaTiO3 Thin Films

“…Within the array of surface characterization methodologies, atomic force microscopy (AFM) stands as a potent technique for acquiring comprehensive three-dimensional (3D) topographic representations of surfaces [10,11]. Furthermore, a multitude of approaches have come to fruition and solidified their presence in the past decade, facilitating the examination of 3D AFM maps for the discrimination and quantification of key parameters pivotal in evaluating the intricacies of surface roughness [12][13][14][15][16][17]. These methodologies encompass the determination of Minkowski functionals [12,13], fractal [14,15], and multifractal [16,17] analyses, among other insightful techniques.…”

“…Furthermore, a multitude of approaches have come to fruition and solidified their presence in the past decade, facilitating the examination of 3D AFM maps for the discrimination and quantification of key parameters pivotal in evaluating the intricacies of surface roughness [12][13][14][15][16][17]. These methodologies encompass the determination of Minkowski functionals [12,13], fractal [14,15], and multifractal [16,17] analyses, among other insightful techniques. Batista et al recently presented the kinetics of ciprofloxacin reduction in Bi 0.5 Na 0.5 Ba(TiO 3 ) 2 electrocatalytic thin films, influenced by structural and micromorphological conditions [18].…”

Evaluating the Topological Surface Properties of Cu/Cr Thin Films Using 3D Atomic Force Microscopy Topographical Maps

“…Atomic force microscopy (AFM) is a powerful characterization technique to obtain three-dimensional (3D) atomic force microscope (AFM) topographical maps of surfaces [19,20]. Additionally, a variety of methods have emerged and consolidated during the last decade for the analysis of the three-dimensional (3D) atomic force microscope (AFM) maps to differentiate and quantify characteristic parameters in the determination of the complexity of the layer surface roughness [21][22][23][24][25][26][27][28][29]. Such methods include the determination of Minkowski functionals [21][22][23], fractal [24][25][26], and multifractal [27][28][29] analyses, among others.…”