2016
DOI: 10.1016/j.jallcom.2016.02.069
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Morphological and optical studies of zinc oxide doped MgO

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Cited by 25 publications
(4 citation statements)
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“…The refractive index values are also dependent on the experimental optical measurement technique used (spectrophotometry or spectroscopic ellipsometry) and the approaches used for extraction of the refractive index from these measurements [78]. Table 1 presents a small part of the reference data for n values of ZnO materials, prepared by different methods [6,78,79,[81][82][83][84][85][86][87][88][89][90][91]. It can be seen that the refractive index values vary in a very broad range.…”
Section: Uv-vis Spectroscopy-optical Characterizationmentioning
confidence: 99%
“…The refractive index values are also dependent on the experimental optical measurement technique used (spectrophotometry or spectroscopic ellipsometry) and the approaches used for extraction of the refractive index from these measurements [78]. Table 1 presents a small part of the reference data for n values of ZnO materials, prepared by different methods [6,78,79,[81][82][83][84][85][86][87][88][89][90][91]. It can be seen that the refractive index values vary in a very broad range.…”
Section: Uv-vis Spectroscopy-optical Characterizationmentioning
confidence: 99%
“…In this work, zinc oxide (ZnO) crystal has been chosen as a crystal to be grown with zinc silicate (Zn 2 SiO 4 ) crystal due to its ability to develop semiconductor material with huge direct transition allowed optical band gap energy (3.37 eV) [16] as well as high exciton binding energy (more than 60 meV) [17] added with exceptionally good thermal and chemical stability [18]. Therefore, ZnO crystal can be a proper application as a phosphor host in light-emitting diodes [19].…”
Section: Introductionmentioning
confidence: 99%
“…For monolithically integrated module efficiency calculations, one-dimensional Fresnel calculations were performed by using the transfer-matrix method. Layer thicknesses and material optical constants were used to calculate the transmittance of above-band-gap photons (400–1250 nm) through an industry-standard stack of 50 nm Zn­(O,S,OH)/50 nm Zn 0.8 Mg 0.2 O/B:ZnO (Al:ZnO optical constants were used for lack of B:ZnO data) layers and into the CIGS layer. The calculated transmittance was weighted to the AM1.5G spectrum, integrated, and scaled to the world record short-circuit current density ( J SC ).…”
Section: Methodsmentioning
confidence: 99%