Abstract:With the development of the third generation synchrotron radiation sources the X-ray photoemission electron microscopy (XPEEM) is playing as a powerful tool for analyzing specimens with spatial resolution about tens of nanometer. It has been used to observe the chemical reaction process, and to investigate the surfaces, interfaces, thin films, buried layers and nano-structures. XPEEM image signals are contributed from photoelectrons, Auger electrons, backscattering electrons and secondary electrons excited by … Show more
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