Monte Carlo simulation of secondary electron emission from the insulator SiO2

Schreiber, E.; Fitting, H.‐J.

doi:10.1016/s0368-2048(01)00368-1

Cited by 114 publications

(79 citation statements)

References 26 publications

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“…Various methods of surface analysis [1][2][3] are based on it as well as a number of materials processing techniques [4]. In these applications the electron energy is above 100 eV and backscattering and secondary electron emission, the physical processes involved, are sufficiently well understood [5][6][7][8][9][10][11][12]. The situation is different for electron-surface interaction at energies below 100 eV, as it occurs in dielectric barrier discharges [13][14][15], dusty plasmas [16][17][18][19][20], Hall thrusters [21,22], and electric probe measurements [23].…”

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confidence: 99%

Absorption of an Electron by a Dielectric Wall

Bronold

Fehske

2015

Phys. Rev. Lett.

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We introduce a method for calculating the probability with which a low-energy electron hitting the wall of a bounded plasma gets stuck in it and apply the method to a dielectric wall with positive electron affinity smaller than the bandgap using MgO as an example. In accordance with electron beam scattering data we obtain energy-dependent sticking probabilities significantly less than unity and question thereby for electrons the perfect absorber assumption used in plasma modeling.PACS numbers: 68.49. Jk, 79.20.Hx, 52.40.Hf The interaction of electrons with surfaces plays a key role in applied science. Various methods of surface analysis [1][2][3] are based on it as well as a number of materials processing techniques [4]. In these applications the electron energy is above 100 eV and backscattering and secondary electron emission, the physical processes involved, are sufficiently well understood [5][6][7][8][9][10][11][12]. The situation is different for electron-surface interaction at energies below 100 eV, as it occurs in dielectric barrier discharges [13][14][15], dusty plasmas [16][17][18][19][20], Hall thrusters [21,22], and electric probe measurements [23]. Much less is quantitatively known about it, especially at very low energies, below 10 eV. For instance, the probability with which a low-energy electron gets stuck in the wall after hitting it from the plasma is unknown. In the modeling of bounded plasmas [24][25][26][27][28] it is assumed to be close to unity, implying for electrons the wall is a perfect absorber [29], irrespective of the material. Since electron absorption and extraction (by charge-transferring heavy particle collisions) control the wall potential, and hence the plasma sheath, which in turn affects the bulk plasma, the electron sticking probability is a crucial parameter. That its magnitude matters and should be known precisely has been recognized most clearly by Mendis [20] in connection with grain charging in dusty plasmas but the theoretical work [30,31] he refers to is based on classical mechanics not applicable to electrons.In this work we apply quantum mechanics to calculate the probability with which a low-energy electron is absorbed by a surface. We couch the presentation in a particular application: The calculation of the electron sticking probability at room temperature for a dielectric wall [32] with positive electron affinity χ smaller than the bandgap E g . But the approach is general and can be also applied to other cases. It utilizes two facts noticed by Cazaux [1]: (i) low-energy electrons do not see the strongly varying short-range potentials of the surface's ion cores but a slowly varying surface potential and (ii) they penetrate deeply compared to the lattice constant into the surface. The scattering pushing the electron back to the plasma occurs thus in the bulk of the wall suggesting the probability for the electron to get absorbed by it to be the probability for transmission through the wall's surface potential times the probability to stay inside the wall desp...

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confidence: 99%

Absorption of an Electron by a Dielectric Wall

Bronold

Fehske

2015

Phys. Rev. Lett.

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“…Other possibility is to follow particular products of each inelastic collision (Schreiber and Fitting, 2002;Kieft and Bosch, 2008). Corresponding scattering cross-sections can be derived using optical data for dispersion relations (including the acoustic deformation potential and longitudinal optical phonos properties for insulators).…”

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Modeling the secondary emission yield of salty ice dust grains

Richterová

Němeček

Pavlu

et al. 2011

Icarus

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Please cite this article as: Richterová, I., Němeček, Z., Pavlu, J., Beránek, M., Šafránková, J., Modeling the secondary emission yield of salty ice dust grains, Icarus (2010Icarus ( ), doi: 10.1016Icarus ( /j.icarus.2010 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting proof before it is published in its final form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.Modeling the secondary emission yield of salty ice dust grains AbstractSecondary emission is one of important processes leading to dust grain charging in many plasma environments. The secondary yield varies with the grain material, shape, and size. Several experiments confirmed that the yield of small grains differs from that of planar samples. Among other materials, ices of different compositions can be frequently found in the interplanetary space and/or planetary magnetospheres. However, the admixtures can significantly influence the inner structure of such materials and thus may change their yield. We present numerical simulations that provide a realistic description of the secondary emission process from water ice grains. The simulations reveal that the secondary emission yield increases as the grain dimension decreases to tens of nanometers. The yield of backscattered primary electrons approaches unity and the grain can be charged to high positive potentials under these conditions. We found that any reasonable admixture of NaCl does not alter secondary electron emission properties significantly.

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“…Comparison of the results by the calibrated DDR model with the experimental data, 31 MonteCarlo simulations, 52 and the formula of Agarwal 51 for a silica sample is shown in Fig. 7 (right).…”

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A modified and calibrated drift-diffusion-reaction model for time-domain analysis of charging phenomena in electron-beam irradiated insulators

2018

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This paper presents a modified self-consistent drift-diffusion-reaction model suitable for the analysis of electron-beam irradiated insulators at both short and long time scales. A novel boundary condition is employed that takes into account the reverse electron current and a fully dynamic trap-assisted generation-recombination mechanism is implemented. Sensitivity of the model with respect to material parameters is investigated and a calibration procedure is developed that reproduces experimental yield-energy curves for uncharged insulators. Long-time charging and yield variations are analyzed for stationary defocused and focused beams as well as moving beams dynamically scanning composite insulators.

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Monte Carlo simulation of secondary electron emission from the insulator SiO2

Cited by 114 publications

References 26 publications

Absorption of an Electron by a Dielectric Wall

Absorption of an Electron by a Dielectric Wall

Modeling the secondary emission yield of salty ice dust grains

A modified and calibrated drift-diffusion-reaction model for time-domain analysis of charging phenomena in electron-beam irradiated insulators

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