2021
DOI: 10.1109/ojpel.2021.3116070
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Monte Carlo-Based Reliability Estimation Methods for Power Devices in Power Electronics Systems

Abstract: Monte Carlo simulation has been widely used for reliability assessment of power electronic systems. In this approach, multiple simulations are carried out during the lifetime estimation of the components in power converter, e.g., power devices, where the parameter variations are considered. In the previous mission-profile based reliability assessment methods, the dynamic thermal stress profiles are usually converted into a set of static parameters. However, this simplification may introduce a certain uncertain… Show more

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Cited by 21 publications
(9 citation statements)
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“…For higher fidelity modelling, the conclusions from [4], [24], [25] are that temperature and the cycling effects of temperature are pertinent causes of failure in PEC systems. Physics of Failure (PoF) approaches based on [5], [26], [27] detail such electrical and thermal modelling of the power converter and can be incorporated into Monte Carlo simulations to provide a more accurately defined lifetime estimate for the converter.…”
Section: Reliability Evaluation Of Power Electronic Convertersmentioning
confidence: 99%
“…For higher fidelity modelling, the conclusions from [4], [24], [25] are that temperature and the cycling effects of temperature are pertinent causes of failure in PEC systems. Physics of Failure (PoF) approaches based on [5], [26], [27] detail such electrical and thermal modelling of the power converter and can be incorporated into Monte Carlo simulations to provide a more accurately defined lifetime estimate for the converter.…”
Section: Reliability Evaluation Of Power Electronic Convertersmentioning
confidence: 99%
“…In this paper, the rain flow counting method is used to calculate the IGBT thermal cycle number n i , the mean junction temperature T jm in each thermal cycle, the junction temperature fluctuation ΔT j and other IGBT thermal load information [35]. The IGBT failure cycles were calculated using the IGBT analytical life model shown in (21), which was derived from the accelerated power cycle test data.…”
Section: The Lcoe Of the Pv System Evaluation Processmentioning
confidence: 99%
“…The IGBT lifetime assessment process based on the mission profile is usually divided into three steps: first, the IGBT junction temperature is calculated based on the PV inverter mission profile, then thermal load statistics are performed based on the IGBT junction temperature information, and finally, the analytical lifetime model and the Miner criterion are used to estimate the IGBT lifetime [17][18][19]. At the same time, considering the randomness and difference of device and lifetime model parameters, references [20] and [21] used the Monte Carlo simulation method to randomly sample 10000 samples to obtain the lifetime distribution of power device IGBT. They also used the lifetime corresponding to 10% unreliability as IGBT lifetime evaluation.…”
Section: Introductionmentioning
confidence: 99%
“…[117]. In this case, the Monte Carlo simulation (with a large number of simulations) will thus result in a distribution indicating the probability of each of the possible outcomes [118]. After that, the PDF is obtained using a distribution in Table . V. From the lifetime distribution of the component it is also possible to obtain the component unreliability function F(x), which is the CDF of the distribution (Fig.…”
Section: V) Parameter Estimation and Lifetime Distributionmentioning
confidence: 99%