“…Common methods range from locating simple image corners (Cheng, Maimone, & Matthies, 2005;Nister et al, 2004) to using descriptive feature detectors such as scale invariant feature transform (SIFT) (Schleicher et al, 2007;Se, Lowe, & Little, 2001) or maximally stable extremal regions (MSER) (Matas, Chum, Urban, & Pajdla, 2004). Methods for matching features are equally as diverse in the literature, with some relying on feature patch template matching methods (Davison, Reid, Molton, & Stasse, 2007), correlation peaks (Cheng et al, 2005), or feature descriptor key matching (Se et al, 2001).…”