Monitoring of the current-distribution uniformity in bipolar transistors from the dependence of internal-feedback factor on collector voltage

Сергеев, В. А.; Dulov, O. A.; Kulikov, Alexander A.

doi:10.1134/s1063782610130117

Semiconductors

2010

DOI: 10.1134/s1063782610130117

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Monitoring of the current-distribution uniformity in bipolar transistors from the dependence of internal-feedback factor on collector voltage

В. А. Сергеев

O. A. Dulov

Alexander A. Kulikov

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Monitoring of the current-distribution uniformity in bipolar transistors from the dependence of internal-feedback factor on collector voltage

Cited by 1 publication

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Nondestructive method for determining the voltage of current pinching in powerful radiofrequency and microwave bipolar transistors

Nondestructive method for determining the voltage of current pinching in powerful radiofrequency and microwave bipolar transistors

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