Monitoring and maintenance of spares and one shot devices

Newby, MJ Martin

doi:10.1016/j.ress.2007.02.008

Cited by 30 publications

(8 citation statements)

References 3 publications

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“…xO=iDU= xDWPo |=yxO=O R= xOt; CUO x@ G}=Dv R= Ov=wD@ xm OwW xDiQo Q=m x@ |}xw}W u}UB`} RwD w u}W}B`} RwD R= xO=iDU= pmWt u}=`iQ |= Q@ |O=yvW}B VwQ "Ovm x@ xvwtv |xR=Ov= u} QDtm =@ u=wD|t ? }DQD u}O@ "CU= u} R}@ VwQ`w[wt xm CU= u}=`iQ |= Q@ R}v [4] Qvq w Oww "O}UQ xrwtLt u=v}t]= C}r@=k |= Q@ |@ wN Cw=[k "OvDiQo Q=m x@ = Q u} R}@ VwQ pmWt |=yxv=t=U u=v}t]= C}r@=k u} R}@ VwQ R= xO=iDU= =@ [5] Vv=Q=mty w ui 'p=tQv u}W}B`} RwD xU =yu; "OvQw; CUO x@ Qta ?=DW uwtR; s=Hv= =@ = Q xQ=mlD TBU w OvOQm xO=iDU= u=v}t]= C}r@=k w CUmW MQv u}tND |= Q@ = Q =D@ w |}=tv =yv; xm |}xH}Dv "OvOQm |HvUQ=@Da= w xU}=kt wrQ=m Cvwt |R=Ux}@W =@ = Q G}=Dv xU R= s=Om Qy ?=NDv= OvQ=O |i=m C=aq]= =yxO=O |Dkw xm CU= u}= OvDiQo |DL =} sm =yCUmW |=yxO=O xm |v=tR =t= OQ=O |y@=Wt OQmrta q=@`}RwD QDy@ p=tQv |v}W}B`} RwD =@ u} R}@ VwQ OyO|t u=Wv |R=Ux}@W G}=Dv CU= QiY "CU= xvwtv |xR=Ov= x@ =yQDt=Q=B u}tND xm OvO=O u=Wv sy [6] Vv=Q=mty w uwUv=O |xar=]t "OvQDT=UL OvW=@ QDlJwm =yxO=O xJ Qy XwYN x@ OvDUy T=UL =iO CQ= Rw QO =ylWwt w =y?t@ u=v}t]= C}r@=k u}tND x@ \w@Qt Qo}O \@DQt ltm u} R}@ VwQ R= sy =yu; w CiQo s=Hv= [7] KrYt w TD} \UwD xm CU=}r=QDU= "OvDiQo O=OaD xm|v=tR = Q xQ=mlD |=yxv=t=U u=v}t]= C}r@=k [8] Vv=Q=mty w =wo u=v}t]= C}r@=k =yu; "OvOQm |UQQ@ 'OvDUy QiY x@ l}ORv =} QiY =yCUmW |=y|UQR=@ w V}=B CLD Cr=L wO QO w C=a]k u=v}t]= C}r@=k ltmx@ = Q xv=t=U |UQQ@ =Hl} w ?QNt CQwY x@ xv=t=U u=v}t]= C}r@=k xm |Dr=L R}v w ?QNtQ}e |xR=Ov= u}}aD |= Q@ = Q VwQ wO u}@ |Dw=iD|@ RQt TBU "OvOQm xU}=kt w x@U=Lt OwW "OvOQw; CUO x@ 'OvQ}o@ Q= Qk C=a]k uwtR; OQwt O}=@ xm |}xvwtv |=t}B=wy QO xDiQ Q=m x@ l}D=twD= nviD u=v}t]= C}r@=k [9] T}r=w w QDv} w xQ=mlD VN@ wO pt=W nviD u}= "OvOQm pOt 1 = RVD; |=ynvWi =@ = Q zpl-20 = RVD; |=ynvWi O=OaD w ?= QN |=yxrwro O=OaD p}rLD w x} RHD =@ =yu; "CU= Q}F -=D nviD u=v}t]= C}r@=k Q@ xvwoJ xQ=mlD C=a]k u=v}t]= C}r@=k xm OvO=O u=Wv xLrU= |xO}J}B |xv=t=U u=v}t]= C}r@=k u}vJsy [10] T}r=w w |mwm "OQ=Po|t xO=iDU= u; R= nviD |L=Q] |R=Uxv}y@ |= Q@ w |UQQ@ 'OQ=O xQ=mlD C=a]k xm '= Q "OvOQm |=yuwtR; xm |v=tR = Q xQ=mlD |=yxv=t=U C=a]k |Q=Oyov w V}=B [11] |=@w}v C=a]k |mD w |ywQo |=y|UQR=@ |= Q@ |rOt w OQm |UQQ@ 'OvDU}v j}kO ?QNtQ}e C= R}yHD |}xQwO uwtR; [12] Rv}DQ=t "OQm O=yvW}B |}=tvCUQO |xv}W}@ VwQ ltm =@ u=Wv w OQm |UQQ@ 'OvwW|t |Q=Oyov Q=@v= QO |vqw] COt |= Q@ xm '= Q |m}vwQDmr= [13] u= Q=mty w nv=w "OQm x@U=Lt u=wD|t = Q =yu; u=v}t]= C}r@=k xvwoJ xm O=O |UQQ@ xv=Q}oW}B Cv l} =@ = Q u=v}t]= C}r@=k Q@ |vD@t C= Q}taD w |Q=Oyov R}v "OvOQm C=k}kLD R= |NQ xa]k u=v}t]= C}r@=k`} RwD "3"2…”

Section: R= |Q=oyov W C}a[w V}=bmentioning

confidence: 99%

پایش وضعیت و نگهداری از قابلیت اطمینان سامانه های تک کاره

مهرورز¹,

منفرد²,

فارسی³

et al. 2018

مهندسی صنایع و مدیریت

View full text Add to dashboard Cite

m.sha ee@cran eld.ac.uk V}=B 'C= Q}taD w |Q=Oyov 'xQ=mlD |=yxv=t=U 'u=v}t]= C}r@=k %|O}rm u=oS=w "|R=Uxv}y@ 'u}R}@ VwQ '|}=tv C=a]k '?QNtQ}e uwtR; 'C}a[w xtOkt "1 |Q=Oyov Qo}O w OvwQ|t u}@ R= xO=iDU= ZLt x@ CqwYLt u}= = Q} R &OwW|t jq]= CqwYLt u}= , qwtat 'p=L u}= =@ "Ow@ Oy=wN =vat |@ Qta pw] QO =yu; R= C= Q}taD w xDiQo Q=m x@ sRq u=tR QO =D OvwW|t |Q=Oyov xO=iDU= |= Q@ xO=t; Cr=L QO =yQ=@v= QO CU= xOW p}O@D |tyt Vr=J x@ sRq u=tR QO uOQmQ=m CUQO u}ty w [1] OvwW 'ViQYt u=tR =D OwW|t |Q=Oyov Q=@v= QO xm |}xv=t=U u=v}t]= C}r@=k xm = QJ Q= Qk xO=iDU= OQwt Rwvy |Dkw |DL OwW|t p=wR =} |@=QN Q=JO 'u=tR CWPo =@ "CU= xDiQov QO xQ=mlD |xv=t=U l} u=wva x@ lWwt |Q=m Qta |xNQJ 1 pmW QO Q@ ?Yv s=ovy =} CU= Q=@v= QO xm |v=tR xrtH R= 'u; Qta hrDNt |=yC}akwt Cra "CU= xOW xO=O u=Wv 'OQ@|t QU x@ Q=_Dv= QO xO=iDU= |= Q@ |Dkw =} wmU |wQ |wQ Q}N@D =} '|oO}Wmsv '|}=}t}W O=Ui '|oORnvR '|oOQwN Ov=wD|t =y|@=QN xmv}= =@ 'Cra u}ty x@ "OW=@ |m}vwQDmr= w |m} QDmr= '|m}v=mt '|}=}t}W C=a]k x@ OwW|t xDU=m u=tR QwQt x@ Vv=v}t]= C}r@=k |rw CU= xOQmv Q=m Rwvy xv=t=U u=v}t]= p@=k |Qw=: vi Q@ Q=m Q_v R= Qo}O OW QDtm |YNWt OL R= |Dkw xm |Qw] |Ov}= Qi p=wR =} |@=QN Ov}=Qi xm =Hv; R= =t= "OwW GQ=N xOQ R= O}=@ w Ow@ Oy=wNv R= TB , qFt Q=@v= QO Ct=k= COt pw] |=v@t Q@ , =iQY u=wD|tv 'CU= |iO=YD '|QDWt C= Q=_Dv= V}=Ri= w |v=yH O}OW C@=kQ '|Qw=: vi QO`}QU |=yCiQW}B |t=_v C=L}rUD Ovv=t C}i}m =@ w T=UL CqwYLt u=oOvvmO}rwD Q@ |O=}R Q=Wi '|L= Q] syt |xeOeO CqwYLt u}= u=v}t]= C}r@=k VHvU "Ovm|t OQ=w |Q=OQ@xQy@ |xrLQt |wQ Q@ |rY= RmQtD xr=kt u}= QO "CU= |Q=OQ@xQy@ w O}rwD XNWt u=v}t]= C}r@=k =@ |DqwYLt OwW|t ZQi xm CQwY u=O@ &CU= u}= |oOwUQi w ?} QND OvwQ Oy=wN|t w= w Ov=xDiQo Q= Qk xOvvmhQYt Q=}DN= QO Q}PBs=Hv= Q=m u}= xvwoJ xm CU= u}= |rY= p=-wU =t= "Ovm C} Q}Ot = Q CqwYLt xrtH R= |DavY CqwYLt u=v}t]= C}r@=k OwW|t ZQi pwtat Qw] x@ #CU= u}vJ CtqU w OvwW|t p=wR w |oOwUQi Q=JO u=tR CWPo =@ |t=_v C=L}rUD "OQm |UQQ@ =yu; Qy=_ |wQ R= w uwQ}@ R= pt=m Qw] x@ u=wD|tv = Q |}=yxv=t=U =} Ovvm|t Q=m CUQO OyO|t u=Wv xm CU=yu; Q=Hiv= =} |R=Ov= Q=m x@ =yvD "Q}N xQ=mlD |=yxv=t=U xQ=BtN w Cm = Q 'lWwt Ovv=t |DqwYLt x@ =yVywSB QO

show abstract

Section: R= |Q=oyov W C}a[w V}=bmentioning

confidence: 99%

پایش وضعیت و نگهداری از قابلیت اطمینان سامانه های تک کاره

مهرورز¹,

منفرد²,

فارسی³

et al. 2018

مهندسی صنایع و مدیریت

View full text Add to dashboard Cite

show abstract

“…This is the case when, once the device is used, it is either destroyed or must be rebuilt. Some typical examples are automobile air bags, fuel injectors, disposable napkins, missiles (Olwell and Sorell, 2001) and fire extinguishers and munition (Newby, 2008). Mainly motivated by the work of Fan et al (2009), Balakrishnan and Ling (2012, 2014 developed efficient EM algorithms for the estimation of model parameters under the assumption of exponential, Weibull and gamma lifetime distributions, respectively.…”

Section: Introductionmentioning

confidence: 99%

Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes

Castilla¹,

Jaenada²,

Pardo³

2022

Preprint

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One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can continue within the experiment, providing extra information for inference, if they did not fail before an inspection time. In addition, their reliability can be rapidly estimated via accelerated life tests (ALTs) by running the tests at varying and higher stress levels than working conditions. In particular, step-stress tests allow the experimenter to increase the stress levels at pre-fixed times gradually during the life-testing experiment. The cumulative exposure model is commonly assumed for step-stress models, relating the lifetime distribution of units at one stress level to the lifetime distributions at preceding stress levels. In this paper, we develop robust estimators and Z-type test statistics based on the density power divergence (DPD) for testing linear null hypothesis for non-destructive one-shot devices under the step-stress ALTs with exponential lifetime distribution. We study asymptotic and robustness properties of the estimators and test statistics, yielding point estimation and confidence intervals for different lifetime characteristic such as reliability, distribution quantiles and mean lifetime of the devices. A simulation study is carried out to assess the performance of the methods of inference developed here and some real-life data sets are analyzed finally for illustrative purpose.

show abstract

“…Therefore, the data from such devices consist of both left‐censored (failure) and right‐censored (success) observations at prefixed inspection time points, and the observations are binary data (failure or not) instead of real failure time data. Other examples of one‐shot devices are automobile airbags, missiles (Olwell and Sorell), and fire extinguishers (Newby). This kind of data is also known as current status data in the survival analysis literature.…”

Section: Introductionmentioning

confidence: 99%

Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses

Castilla¹,

Martín²,

Pardo³

2020

Quality & Reliability Eng

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Introduced robust density-based estimators in the context of one-shot devices with exponential lifetimes under a single stress factor. However, it is usual to have several stress factors in industrial experiments involving one-shot devices. In this paper, the weighted minimum density power divergence estimators (WMDPDEs) are developed as a natural extension of the classical maximum likelihood estimators (MLEs) for one-shot device testing data under exponential lifetime model with multiple stresses. Based on these estimators, Wald-type test statistics are also developed. Through a simulation study, it is shown that some WMDPDEs have a better performance than the MLE in relation to robustness. Two examples with multiple stresses show the usefulness of the model and, in particular, of the proposed estimators, both in engineering and medicine.

show abstract

Monitoring and maintenance of spares and one shot devices

Cited by 30 publications

References 3 publications

پایش وضعیت و نگهداری از قابلیت اطمینان سامانه های تک کاره

پایش وضعیت و نگهداری از قابلیت اطمینان سامانه های تک کاره

Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes

Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses

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