Monitoring active filters under automotive aging scenarios with embedded instrument

Abstract

in automotive mixed-signal SoCs, the analogue/mixedsignal front-ends are of particular interest with regard to dependability. Because of the many electrical disturbances at the front-end, often (active) filters are being used. Due to the harsh environments, in some cases, degradation of these filters may be encountered during lifetime and hence false sensor information could be provided with potential fatal results. This paper investigates the influence of aging in three different types of active filters in an automotive environment, and presents an embedded instrument, which monitors this aging behaviour. The monitor can be used for flagging problems in the car console or initiate automatic correction.

Hierarchical Modeling of Automotive Sensor Front-Ends for Structural Diagnosis of Aging Faults

“…Negative Bias Temperature Instability (NBTI) or/and Hot Carrier Injection (HCI) for PMOS transistors. Figure 5, for example, shows our own model [6] of NBTI aging at maximum temperature for analogue CMOS circuits with stress time on the horizontal axis and the threshold shift ∆ܸ ௧ on the vertical axis. The stress voltages of a square wave and sine wave signal are the parameters in this case.…”

“…The stress voltages of a square wave and sine wave signal are the parameters in this case. information can be used in circuit simulations [6].…”