“…a spatial map of measured backscattering) is typically characterized by a random process 7 . There are a variety of metrics, or features, that can be used to describe this random process, including the autocorrelation function, power spectrum 8 , wavelet decomposition 9 , gray-level co-occurance matrix 6,10 , the mean intensity (scattering cross section) 11,12 and in general, the intensity probability density function (pdf) [13][14][15] .…”