2015
DOI: 10.1016/j.orgel.2015.08.020
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Molecular-scale charge trap medium for organic non-volatile memory transistors

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Cited by 8 publications
(7 citation statements)
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“…The O 1s spectra were fitted using a single peak at 533.7 eV. This value is in good agreement with earlier results when using Ag(111) as the substrate but 0.7 eV higher than reported for HAT on SiO 2 . This difference might originate from the different energy level alignments of HAT on these different substrates.…”
Section: Resultssupporting
confidence: 90%
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“…The O 1s spectra were fitted using a single peak at 533.7 eV. This value is in good agreement with earlier results when using Ag(111) as the substrate but 0.7 eV higher than reported for HAT on SiO 2 . This difference might originate from the different energy level alignments of HAT on these different substrates.…”
Section: Resultssupporting
confidence: 90%
“…The graphene/HAT ratio for the C 1s spectrum was determined by accounting for attenuation from the HAT layer(s), with the HAT thickness determined by the QMB during deposition (see the Supporting Information for further details). We found these peaks at 284.7 and 286.2 eV, respectively, in line with previously reported values for HAT adsorbed on Ag(111) and SiO 2 . The O 1s spectra were fitted using a single peak at 533.7 eV.…”
Section: Resultssupporting
confidence: 89%
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“…An organic/inorganic hybrid trap-based memory device with an Al 2 O 3 dielectric modified by self-assembled monolayer showed clear memory characteristics . A substituted triphenylene trap layer was sandwiched between poly­(methyl methacrylate) (PMMA) and oxide to form a memory element . A variety of polymer compositions have been employed as chargeable dielectrics.…”
Section: Introductionmentioning
confidence: 99%