1981
DOI: 10.1107/s0567739481000247
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Molecular orientation distribution derived from an arbitrary reflection

Abstract: A straightforward method using Legendre series enables the orientation distribution in a specimen with uniaxial symmetry to be derived from the azimuthal profile of a single arbitrary reflection. Moreover, the moments of the distribution (P2,(cos,)) can be obtained directly from the azimuthal profile without needing to calculate the complete distribution.Pole figures derived from X-ray diffraction measurements are the standard method of quantifying orientation in crystalline materials. Similarly, the azimuthal… Show more

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Cited by 127 publications
(89 citation statements)
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“…From the azimuthal intensity distribution in the wide-angle region, the order parameter S is calculated according to the widely used procedure introduced by Lovell and Mitchell. [10] As seen from Figure 6 and 7, on macroscopic deformation, S is also not affected and remains constant at S ¼ 0.59. To determine the correlation length of the smectic layers, the small-angle reflex of a radial scan is fitted with a pseudo-Voigt function, which describes the broad diffraction peaks well.…”
Section: à2mentioning
confidence: 74%
“…From the azimuthal intensity distribution in the wide-angle region, the order parameter S is calculated according to the widely used procedure introduced by Lovell and Mitchell. [10] As seen from Figure 6 and 7, on macroscopic deformation, S is also not affected and remains constant at S ¼ 0.59. To determine the correlation length of the smectic layers, the small-angle reflex of a radial scan is fitted with a pseudo-Voigt function, which describes the broad diffraction peaks well.…”
Section: à2mentioning
confidence: 74%
“…The [26,27] A Leica DM LB optical microscope equipped with a Linkam CSS450 hot-stage was used to analyze the homogeneity of the samples.…”
mentioning
confidence: 99%
“…This is a special case of a more general relationship between the scattering order parameter and the order parameter of the particles for uniaxial systems [23]. The factor required is theP 2 of the particle form factor at the Q value of the circle used to calculateP 2,S ,…”
Section: X-ray Scattering Backgroundmentioning
confidence: 99%