2005
DOI: 10.1021/jp046490p
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Molecular Orientation and Film Morphology of Pentacene on Native Silicon Oxide Surface

Abstract: The growth morphology and mechanism of pentacene films on native Si oxide surface have been studied by using high-resolution electron energy loss spectroscopy (HREELS), X-ray diffraction (XRD), and atomic force microscopy (AFM). Despite the good agreement between our own and the reported XRD results, the previous XRD interpretation that the pentacene molecules are tilt-standing on the substrate cannot explain our HREELS data. The HREELS results show that a substantial portion of the first two layers of pentace… Show more

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Cited by 38 publications
(42 citation statements)
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“…This is in contrast to the Stranski-Krastanov-type growth reported for P thin films on SiO 2 , where at least one complete layer is being formed on which island are built up. 40 The PQ submonolayer film exhibits an area coverage of only 10% ͑due to the instant formation of multilayer islands͒ and an island density ͑N͒ of 1.4 m −2 . For comparison, a P film of same nominal thickness had a coverage of 50% and N = 5.5 m −2 .…”
Section: A Thin Pq Filmsmentioning
confidence: 99%
“…This is in contrast to the Stranski-Krastanov-type growth reported for P thin films on SiO 2 , where at least one complete layer is being formed on which island are built up. 40 The PQ submonolayer film exhibits an area coverage of only 10% ͑due to the instant formation of multilayer islands͒ and an island density ͑N͒ of 1.4 m −2 . For comparison, a P film of same nominal thickness had a coverage of 50% and N = 5.5 m −2 .…”
Section: A Thin Pq Filmsmentioning
confidence: 99%
“…This is consistent with previous results. [18][19][20] It is interesting to note that the measured d 001 is somewhat smaller than the length of a single pentacene molecule ͑1.60 nm͒. This suggest that the long axes of the pentacene molecules are slightly tilted.…”
Section: B X-ray Diffractionmentioning
confidence: 99%
“…15,16 Therefore, investigation and control of the polymorphism and film structures are demanded to improve device performance of OTFTs. Several studies on the structure and the growth mechanism of pentacene films have been carried out; [17][18][19][20][21][22][23][24] however, the mechanism of the transformation from the thin-film phase to the bulk phase is not fully clarified.…”
mentioning
confidence: 99%