2005
DOI: 10.1103/physrevb.72.075315
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Molecular-dynamics-based model for the formation of arsenic interstitials during low–temperature growth of GaAs

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Cited by 4 publications
(2 citation statements)
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“…4). In addition to the absolute minimum above the surface, here at h = 1.3 Å, and the relative minimum at the interstitial position (h = -0.22 Å), there is another, relative minimum above the surface at h = 2.6 Å, which probably relates to the interaction with the migration layer which is present above the reconstruction layer [29]. The energy barrier for escape from the interstitial position (h = -0.22 Å) is 68 meV in this case.…”
Section: Formation Of An Interstitial As 2 Moleculementioning
confidence: 90%
“…4). In addition to the absolute minimum above the surface, here at h = 1.3 Å, and the relative minimum at the interstitial position (h = -0.22 Å), there is another, relative minimum above the surface at h = 2.6 Å, which probably relates to the interaction with the migration layer which is present above the reconstruction layer [29]. The energy barrier for escape from the interstitial position (h = -0.22 Å) is 68 meV in this case.…”
Section: Formation Of An Interstitial As 2 Moleculementioning
confidence: 90%
“…has been related to the formation of As interstitials [3] or, alternatively, to As antisites [4]. Moreover, intrinsic interstitials have been demonstrated to play a crucial role in the diffusion processes of p-type dopants in GaAs [5,6].…”
mentioning
confidence: 99%