2010
DOI: 10.1063/1.3478226
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Molecular beam epitaxy of N-polar InGaN

Abstract: Influence of the substrate misorientation on the properties of N-polar GaN films grown by metal organic chemical vapor deposition

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Cited by 69 publications
(59 citation statements)
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“…Samples A and B were prepared at TopGaN. They were grown in a V90 VG Semicon MBE system equipped with a UNI-Bulb Veeco radio-frequency N 2 plasma source for active N, and solid-source effusion cells 4,6,7 More details about the growth conditions and properties of these samples can be found elsewhere. 4 Two additional series of samples (C-F and G-J) were grown at PDI in a custom-designed CRE-ATEC PA-MBE system equipped with a UNI-Bulb Veeco radio-frequency plasma source for the generation of active N, and solid-source effusion cells for Ga and In.…”
Section: Experiments and Methodsmentioning
confidence: 99%
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“…Samples A and B were prepared at TopGaN. They were grown in a V90 VG Semicon MBE system equipped with a UNI-Bulb Veeco radio-frequency N 2 plasma source for active N, and solid-source effusion cells 4,6,7 More details about the growth conditions and properties of these samples can be found elsewhere. 4 Two additional series of samples (C-F and G-J) were grown at PDI in a custom-designed CRE-ATEC PA-MBE system equipped with a UNI-Bulb Veeco radio-frequency plasma source for the generation of active N, and solid-source effusion cells for Ga and In.…”
Section: Experiments and Methodsmentioning
confidence: 99%
“…This latter result reflects again the enhanced In incorporation efficiency along the [0001] direction as reported previously by several groups. 4,6,7 2. Low-temperature photoluminescence with resonant excitation Figure 5 presents the low-temperature (10 K) µ-PL spectra excited at 413 nm (473 nm for samples E and F) of the Ga-(a) and N-polar (b) In x Ga 1−x N/In y Ga 1−y N QWs.…”
Section: Morphological and Structural Characterizationmentioning
confidence: 99%
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“…The growth of group-III nitrides on an N-polar plane has attracted much attention because they enable the growth of high-quality InGaN with high In composition owing to their thermal stability, which is higher than those grown on a Ga-polar plane. [1][2][3] In addition, in N-polar InGaN/GaN heterostructures, the spontaneous and piezoelectric polarization directions were reversed from those in Ga-polar structures, which could be advantageous for operating green or longer-wavelength InGaN light-emitting devices and solar cells. 4,5 However, metalorganic chemical vapor deposition (MOCVD) growth of N-polar GaN on sapphire typically leads to the formation of a rough surface morphology with hexagonal pyramidal structures and lower crystalline quality than Ga-polar GaN.…”
mentioning
confidence: 99%
“…The N-polar orientation of GaN was used in this work to achieve high composition InGaN for efficient inter-band tunneling. N-polar InGaN was grown using the conditions and growth model developed earlier 14,15 . InGaN was grown at a substrate temperature of 550 0 C followed by 70nm of p GaN (N A ~ 5 X 10 19 cm -3 ).…”
mentioning
confidence: 99%