1983
DOI: 10.1002/pssa.2210750239
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Molecular beam epitaxy of AlSb on GaAs and GaSb on AlSb films

Abstract: Single crystalline AlSb films are successfully grown, by MBE on GaAs substrates at temperatures higher t,han 400 "C. The surface gives a C(2 x 6) structure under Sb stabilized conditions. Undoped X1Sb is p-type with resistivities of lo2 t,o lo3 ncm. Then, GaSb films are grown on AISb/GaSs. It, can be seen, from RHEED observation that the interface between AlSb and GaSb is very smooth, and the layer growth continues a t the interface. Fabricating that structure improves the properties of GaSb in comparison with… Show more

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Cited by 10 publications
(3 citation statements)
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“…In fact, Gotoh et al have reported higher hole mobilities for GaSb grown on AlSb/GaAs than for GaSb grown directly on GaAs. 16 The AlSb layer, having a wider band gap than GaSb, should also act as a barrier for minority carrier recombination at the interface with the substrate.…”
Section: -mentioning
confidence: 99%
“…In fact, Gotoh et al have reported higher hole mobilities for GaSb grown on AlSb/GaAs than for GaSb grown directly on GaAs. 16 The AlSb layer, having a wider band gap than GaSb, should also act as a barrier for minority carrier recombination at the interface with the substrate.…”
Section: -mentioning
confidence: 99%
“…where the constant a is the same defined for process (1). The PAS signal for processes (3) and (4) shows the same dependence on the modulation frequency.…”
Section: Theoretical Backgroundmentioning
confidence: 88%
“…Potentially it can be highly resistive and is closely lattice matched to GaSb and therefore has been used as semiinsulating substrate or buffer layer for the epitaxial growth of GaSb [1,2]. AlSb has an indirect band gap with an energy of 1.62 eV [3] and thus is a good candidate for applications such as high-energy photon detectors and as a barrier material to confine electrons in antimonide heterostructure devices [4], in InAs-channel high electron mobility transistors [5,6] and magnetoelectronic hybrid Hall effect devices [7].…”
Section: Introductionmentioning
confidence: 99%