2008
DOI: 10.1021/ja800563h
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Molecular Assembly of a 3D-Ordered Multilayer

Abstract: Combining strong metal-ligand coordination and pi-pi interactions affords a 3D-ordered molecular-based multilayer. The organization of the assembly is apparent from the optical properties and X-ray reflectivity.

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Cited by 55 publications
(83 citation statements)
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References 30 publications
(25 reference statements)
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“…Subtle changes in electronic structure of conjugated oligomers have been previously predicted by DFT calculations. [3b,d, 21, 22] In conclusion, we have demonstrated the ability to tune the band gaps of relatively long (> 10 nm), surface-bound metal-organic oligomers, [7,8,12,23] while preserving the adopted structure and chemical framework. HOMO-LUMO engineering to generate small band-gap materials is an important challenge in building up materials with potential electronic functionality.…”
mentioning
confidence: 94%
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“…Subtle changes in electronic structure of conjugated oligomers have been previously predicted by DFT calculations. [3b,d, 21, 22] In conclusion, we have demonstrated the ability to tune the band gaps of relatively long (> 10 nm), surface-bound metal-organic oligomers, [7,8,12,23] while preserving the adopted structure and chemical framework. HOMO-LUMO engineering to generate small band-gap materials is an important challenge in building up materials with potential electronic functionality.…”
mentioning
confidence: 94%
“…The deposition strategy used had previously resulted in assemblies with roughness values in the range of 0.3-2 nm, with 1-PdCl 2 assemblies being the least rough. [7,8,12,13] The thickness determined from fitting the XRR data is 4.5 nm (Figure 3). Based on the thicknesses of the assembly and template layers (Figure 2) and the length of the oligomers (from DFT calculations, see below), the tilt angle can be approximated as about 208.…”
mentioning
confidence: 99%
“…First attempts towards a stepwise self-assembly into the third dimension have been reported recently. [64] …”
Section: Discussionmentioning
confidence: 99%
“…XRR was employed to probe the thickness, roughness, and density of the multilayer films on quartz. This technique has been used to probe multilayer films composed of other molecular building blocks, [38][39][40][41] in addition to ZnTPEP multilayers assembled via the CuAAC method. 8,9 Briefly, the specular reflectance of X-rays off various interfaces of the thin film and substrate result in interference patterns as the angle of incident changes.…”
Section: Electronic Absorption Analysismentioning
confidence: 99%