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Stiickverbtuidc sind ~~cilchenvcrbundwcrkstolle, die aus ciner mctallischen Matrix (MM) i n i t cingclagcrtcn quasikcramisclien Hartphascn ( H P ) hcstchcn. Sic wcrdcn industricll m m VerschleilSschutz eingcsctLt. In Stuckverbundcn cntstehcn wiihrend dcr Abkuhlung Mikrocigcnspannungeii iiufgruiid dei-untcrschiedlichcn physiknlischcri und mcchanischcn Eigcnschaften dcr Hartphasen u n d dcr Metallmatrix. Wcitcrc EinfluBftiktoren auf die Hohe tind Vcrtcilung dcr Mikroeigcnspnnnungen sind die G r X c Form und die Vcrtcilung dcr Hartphascn. Zur Charaktcrisierung dcs Mikrocigcnspannuiigs~ustandes werdcn Bereclinungsvcrlaliren (;iniiIylische Ucrechnungcn. FEM) und cxperimcntellc Vcrlahrcn (Dilatomctric. Mikro-MoirC-Vei-fahren, Riintgcnhcugung. winkcldispersivc Nctitioncnbcugung. N e u t r o n c n l l u~~c i t s p c k t r o n~e t r i e . 'li~r~ionspcndclvcrst~~lie, Dificrentialkalorimetric und ~lllrasch~illabsorp~Ionsmcs,ungen) angcwcndel und bcwcrtet.Particle rcintorced nictal miitrix compositcs (PMMCs) comprising quasi ceramic hard phases in ;I metill matrix arc used for wear protection in industry. DurinS cooling residual microstresscs emerge due to dillerenccs i n the physical and mechanical properties of the metal matrix and the hard phases. Furtheron, the amount and distr-ihution of' t h e 1-esidual microstrcsws arc inlluenccd by the hard phase size, shape a n d distribution.For charactcri;ring the rcsidual niicrostrcss state theoretical methods (iinnlytical and FEM calculationc) iis well as cxpcrimental mcthods (dilatoiiietry. Micro-Moir~-mcthods. X-ray diffraction, angle dispersive neutron dillrirction. neutron time-of-flight spectroscopy, torsion pendulum tests. dil'l'ercntial calorimetry and ultra sonic absorption tcst) are used 2nd asscsscd.
Stiickverbtuidc sind ~~cilchenvcrbundwcrkstolle, die aus ciner mctallischen Matrix (MM) i n i t cingclagcrtcn quasikcramisclien Hartphascn ( H P ) hcstchcn. Sic wcrdcn industricll m m VerschleilSschutz eingcsctLt. In Stuckverbundcn cntstehcn wiihrend dcr Abkuhlung Mikrocigcnspannungeii iiufgruiid dei-untcrschiedlichcn physiknlischcri und mcchanischcn Eigcnschaften dcr Hartphasen u n d dcr Metallmatrix. Wcitcrc EinfluBftiktoren auf die Hohe tind Vcrtcilung dcr Mikroeigcnspnnnungen sind die G r X c Form und die Vcrtcilung dcr Hartphascn. Zur Charaktcrisierung dcs Mikrocigcnspannuiigs~ustandes werdcn Bereclinungsvcrlaliren (;iniiIylische Ucrechnungcn. FEM) und cxperimcntellc Vcrlahrcn (Dilatomctric. Mikro-MoirC-Vei-fahren, Riintgcnhcugung. winkcldispersivc Nctitioncnbcugung. N e u t r o n c n l l u~~c i t s p c k t r o n~e t r i e . 'li~r~ionspcndclvcrst~~lie, Dificrentialkalorimetric und ~lllrasch~illabsorp~Ionsmcs,ungen) angcwcndel und bcwcrtet.Particle rcintorced nictal miitrix compositcs (PMMCs) comprising quasi ceramic hard phases in ;I metill matrix arc used for wear protection in industry. DurinS cooling residual microstresscs emerge due to dillerenccs i n the physical and mechanical properties of the metal matrix and the hard phases. Furtheron, the amount and distr-ihution of' t h e 1-esidual microstrcsws arc inlluenccd by the hard phase size, shape a n d distribution.For charactcri;ring the rcsidual niicrostrcss state theoretical methods (iinnlytical and FEM calculationc) iis well as cxpcrimental mcthods (dilatoiiietry. Micro-Moir~-mcthods. X-ray diffraction, angle dispersive neutron dillrirction. neutron time-of-flight spectroscopy, torsion pendulum tests. dil'l'ercntial calorimetry and ultra sonic absorption tcst) are used 2nd asscsscd.
The Moire fringes can be detected in proper circumstances when a scanning electron microscope (SEM) is used to measure periodic structures /1,,2/. If the dimension of the fleriodic structure of the test object is of the s a m e o r d e r of magnitude as the number of the scanning lines in one sweeping period of the SEM . the existence of the Moire fringes is possible. Usually this happens when magnifications are low and thus the area which is measured is considerably l a r g e r compared to the area where the periodic structure of the test object is seen directly. Therefore we can quite rapidly test the whole area of the grating. This is an advantage when f o r instance the quality of the holographical optical ele-.ments is investigated. -The tested surface relief gratings were prepared by using Shipley AZ-1350 positive photoresist material. The photoresist layers were spin-coated onto the glass plates. To make gratings conductive and thus visible for the SEM they were coated with gold. F o r measuring we used a JEOL 35 CF electron microscope. The Moire patterncould be detected when the grating was mounted grooves to the s a m e direction as the sweeping beam of microscope. The number of the horizontal scanning lines f o r one image on CRT in our experiment was 1000. In Fig. 1 (see on the photo pages before the Short Notes part) the r e a l g r a ting grooves are seen. The magnification is 1100 and the measuring area is 70x100pm2. The deformations of grooves caused by a strong contact are clearly 1) P.O.B. 111, Finland.
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