Moiré in Atomic Force Microscope

Chen, H.; Liu, Dong E.; Lee, A.

doi:10.1111/j.1747-1567.2000.tb01333.x

Cited by 15 publications

(17 citation statements)

References 3 publications

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“…When the scanning lines are taken as a reference grating, they will interfere with a matching specimen grating to generate scanning moiré fringes. The feasibility of AFM moiré has been shown using a SEM (scanning electron microscope) generated parallel grating [8]. However, in traditional moiré interferometry methods, diffraction gratings are commonly used.…”

Section: Principle Of the Afm Moiré Methodsmentioning

confidence: 99%

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Measurements of surface deformations and strains using an AFM moiré method

Zhong

2005

Measurement

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An AFM (atomic force microscope) moiré method has been developed to measure surface deformations and strains. The scanning lines in the AFM monitor are used as the reference grating. The reference grating interferes with the specimen grating and forms a moiré pattern on the monitor. The condition of forming scanning moiré with an AFM is described. The deformation measurement principle using AFM moiré is discussed in detail. The AFM moiré method was used to measure the thermal deformations in QFP (quad flat pack) and BGA (ball grid array) packages. The experiment results verify the feasibility of the AFM moiré method and show its ability to measure the in-plane deformations and strains.

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Section: Principle Of the Afm Moiré Methodsmentioning

confidence: 99%

“…The feasibility of using an AFM (atomic force microscope), which is usually used to measure dimensions [7], to form moiré fringe patterns and measure surface deformations was studied [8]. Thermal deformations and strains of IC packages were measured using the AFM scanning moiré method [9].…”

Section: Introductionmentioning

confidence: 99%

Measurements of surface deformations and strains using an AFM moiré method

Zhong

2005

Measurement

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“…The scanning movement of the AFM scanner can also be used as a parallel reference grating to form scanning moire´fringes. When the scanning lines are taken as the reference grating, they interfere with a matching specimen grating to generate scanning moire´fringes [8,9].…”

Section: The Formation Of the Afm Scanning Moireámentioning

confidence: 99%

An AFM scanning moir� technique for the inspection of surface deformations

Zhong

2004

The International Journal of Advanced Manufacturing Technology

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An atomic force microscope (AFM) scanning moire´technique has been developed and verified in preparation for the measurement of deformations of single point diamond-turned surfaces. It is a nondestructive measurement method without introducing external reference and specimen gratings. This technique has also been successfully applied to measure thermal deformations of electronics packages without introducing an external reference grating. The principle of the formation of an AFM scanning moire´and strain measurement using this technique is explained in detail. Several important issues in its applications such as the measuring errors, scanning directions and selection of the number of scan lines are also discussed.

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“…1 Cross-section of hierarchical structure in Palmetto wood previously obtained using optical microscopy [3] interferometric techniques like marker techniques [4,5] and digital image correlation [6]. Moire interferometry [7][8][9][10], holographic interferometry [11,12] and speckle interferometry [7,8,[13][14][15][16][17][18] have been employed extensively for nanoscale and microscale deformation measurements. A major disadvantage of interferometric techniques is the level of surface preparation required to ensure reflection and interference, which can be extremely challenging for materials like Palmetto wood [19].…”

Section: Introductionmentioning

confidence: 99%

Multi-scale Mechanical Characterization of Palmetto Wood using Digital Image Correlation to Develop a Template for Biologically-Inspired Polymer Composites

et al. 2010

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Palmetto wood is garnering growing interest as a template for creating biologically-inspired polymer composites due to its historical use as an energy absorbing material in protective structures. In this study, quasi-static three-point bend tests have been performed to characterize the mechanical behavior of Palmetto wood. Full-field deformation measurements are obtained using Digital Image Correlation (DIC) to elucidate on the strain fields associated with the mechanical response. By analyzing strain fields at multiple length scales, it is possible to study the more homogeneous mechanical behavior at the macroscale associated with the global load-deformation response; while at the microscale the mechanical behavior is more inhomogeneous due to microstructural failure mechanisms. Thus, it was possible to determine that, despite the presence of discontinuous macro-fiber reinforcement, at the macroscale the response is associated with classical bending and progressive failure processes that are adequately described by Weibull statistics proceeding from the tensile side of the specimen. At the microscale, however, the failure mechanisms giving rise to the macroscopic response consist of both shear-dominated debonding between the fiber and matrix, and inter-fiber matrix failure due to pore collapse.These microscale mechanisms are present in both the compressive and tensile regions of the specimen, most likely due to local macro-fiber bending, which is independent of the global bending state. The pore collapse mechanism observed during mechanical loading appears to improve the energy absorption of the matrix material, thereby, transferring less energy and shear strain to the macro-fibermatrix interface for initiation of debonding. However, the pore collapse mechanism can also accumulate substantial shear strain, which results in matrix shear cracking. Through these complex failure mechanisms, Palmetto wood exhibits a high resistance to catastrophic failure after damage initiation, an observation that can be used as inspiration for creating new polymer composite materials.

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Moiré in Atomic Force Microscope

Cited by 15 publications

References 3 publications

Measurements of surface deformations and strains using an AFM moiré method

Measurements of surface deformations and strains using an AFM moiré method

An AFM scanning moir� technique for the inspection of surface deformations

Multi-scale Mechanical Characterization of Palmetto Wood using Digital Image Correlation to Develop a Template for Biologically-Inspired Polymer Composites

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