“…Additional peaks at 7.4°, 12.8°, 16.4°, and 18.1°, could be assigned to (110), (211), (310), and (222) planes of ZIF‐8. However, no XRD peaks for N‐CDs were observed in ZnO nanotubes with N‐CD embedded ZIF‐8 due to the possible overlap of weak peaks with strong peaks . In addition, the PXRD patterns (Figure c) identified the diffraction peaks at 7.4°, 10.4°, 12.8°, 14.6°, 16.4°, and 18.1° representing the reflections of (110), (200), (211), (220), (310), and (222) planes from the sodalite ZIF‐8, respectively .…”