2016
DOI: 10.1016/j.physleta.2016.05.044
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Modification on graphite due to helium ion irradiation

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Cited by 12 publications
(7 citation statements)
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“…This process of defect generation in graphene is referred to as indirect defects [6]. It was reported previously that sputtered C atoms undergo agglomeration into small clusters due to their high structural fluidity during the process of ion irradiation [31,32]. Direct and indirect defects cause agglomeration of sputtered atoms which presumably resulted in the formation of nanostructures that are observed in this study on ion-implanted EG/SiC in Figure 1c,d.…”
Section: Afmsupporting
confidence: 53%
“…This process of defect generation in graphene is referred to as indirect defects [6]. It was reported previously that sputtered C atoms undergo agglomeration into small clusters due to their high structural fluidity during the process of ion irradiation [31,32]. Direct and indirect defects cause agglomeration of sputtered atoms which presumably resulted in the formation of nanostructures that are observed in this study on ion-implanted EG/SiC in Figure 1c,d.…”
Section: Afmsupporting
confidence: 53%
“…The small increase in interlayer spacing is due to the displacement of carbon atoms to interstitial positions and/or the inclusion of nitrogen atoms in interlayer positions. [ 72 ] During oxidation and N‐doping of graphite, as a cotreatment, the C/O ratio as well as the nitrogen content as a function of the new functional groups formed increased. However, the different diffraction patterns shown in SAED are possibly due to an incomplete oxidation of graphite during both treatments, the overlapping of carbon‐based material planes modified by a different C:N conformation and/or a reorientation depending on the functional groups, modifying the effects of electrostatic and steric repulsion.…”
Section: Resultsmentioning
confidence: 99%
“…In other studies, which were performed using He ion implantation at high (up to MeV) acceleration voltages, changes in the d-spacing of graphite was reported by electron microscopy studies [82,106]. From these it was seen that the generation of defects, which can be vacancies or interstitials, not only occurs but the global structure of these defects is energy dependent [28].…”
Section: -Introductionmentioning
confidence: 90%
“…From these it was seen that the generation of defects, which can be vacancies or interstitials, not only occurs but the global structure of these defects is energy dependent [28]. It was also shown that helium irradiation led to microstructures on the surface such as bubbles indicating ion atomic clustering and damage which is not uniform [82]. This damage from high energy implantation indicates that carbon is sputtered to form the blistered topology reported.…”
Section: -Introductionmentioning
confidence: 98%
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