2019
DOI: 10.1007/s10854-019-01294-0
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Modification of NiOx hole transport layers with 4-bromobenzylphosphonic acid and its influence on the performance of lead halide perovskite solar cells

Abstract: Lead halide perovskites have proved to be exceptionally efficient absorber materials for photovoltaics. Besides improving the properties of the perovskite absorbers, device engineering and the optimization of interfaces will be equally important to further the advancement of this emerging solar cell technology. Herein, we report a successful modification of the interface between the NiO x hole transport layer and the perovskite absorber layer using 4-bromobenzylphosphonic acid based selfassembled monolayers le… Show more

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Cited by 18 publications
(20 citation statements)
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“…By using Br-BA, they achieved an impressively high efficiency of 18.4% with enhanced V oc (1.11 eV) and J sc (21.7 mA cm −2 ). Recently, Mangalam et al [135] used 4-bromobenzylphosphonic acid-based SAMs for NiO x p-i-n PSCs, Figure 8d. The V oc increased from 0.978 to 1.029 V, leading to improved device performance and reduced J-V hysteresis.…”
Section: Wwwadvancedsciencenewscommentioning
confidence: 99%
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“…By using Br-BA, they achieved an impressively high efficiency of 18.4% with enhanced V oc (1.11 eV) and J sc (21.7 mA cm −2 ). Recently, Mangalam et al [135] used 4-bromobenzylphosphonic acid-based SAMs for NiO x p-i-n PSCs, Figure 8d. The V oc increased from 0.978 to 1.029 V, leading to improved device performance and reduced J-V hysteresis.…”
Section: Wwwadvancedsciencenewscommentioning
confidence: 99%
“…They attribute the increased V oc to a deeper valence band energy of NiO after SAM modification. [135] Similarly, Zhang et al [136] utilized ferrocenedicarboxylic acid (FDA) for NiO surface modification, improving the device performance from 15.13% to 18.20%, along with increasing the UV stability and eliminate J-V hysteresis. The FDA modified NiO x based sample retained 49.8% of its original efficiency after exposure to UV light for 24 h as compared to only 3.8% efficiency of the unmodified based NiO x device.…”
Section: Wwwadvancedsciencenewscommentioning
confidence: 99%
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