Modification of electronic properties during adsorption of conjugate organic molecules on the surface of polycrystalline SnO2

Abstract

The modification of the electronic structure during adsorption of ultrathin copper phthalocyanine (CuPc) and 3, 4, 9, 10 perylene tetracarboxylic dianhydride (PTCDA) coatings on the surface of polycrys talline tin dioxide is traced. Auger electron spectroscopy is employed to find changes in the atomic composi tion of the surface. It is found with the help of low energy electron total current spectroscopy using a testing beam of electrons with energies up to 30 eV that the total current spectra typical of organic films are formed when the thickness of the coating being deposited is 2-7 nm. The formation of an interface layer 1.5-2.0 nm in thickness is detected, in which the intensity of the structure of the total current spectra decreases and the effect of interaction of PTCDA molecules with the SnO 2 surface is manifested.

Charge transfer quantification in a SnOx/CuPc semiconductor heterostructure: investigation of buried interface energy structure by photoelectron spectroscopies

“…CuPc is now becoming a more and more popular organometallic compound that is already applied in third generation solar cells, gas sensors and advanced opto-electronic technologies. [15][16][17] Inorganic-organic junctions based on tin oxides have been investigated recently, [18][19][20] however the focus was on characterization and modification of the tin dioxide as the inorganic part of the junction. Works focusing on the properties of the interface between SnO x and the organic material are still rare.…”