Modification of electrode materials for plasma torches

Jankov, I.R.; Szente, R. N.; Goldman, I. D.; Carreño, M.N.P.; Valle, M.; Behar, M.; Costa, Carlos Alberto Rodrigues; Galembeck, Fernando; Landers, Richard

doi:10.1016/j.surfcoat.2005.02.015

Cited by 2 publications

(2 citation statements)

References 7 publications

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“…The Kelvin method using macroscopic or microscopic electrodes has been used in the study of corrosion [88,89], adsorption [90], semiconductors and metals [51,[91][92][93][94][95][96], surface contamination [97], charge pattern imaging on thin film electrets [98][99][100] and nanopatterned surfaces [101,102] as well as dielectric solids [103][104][105][106][107][108][109][110], thin films [111,112], analysis of charged domains in carbon nanotubes [113] and in bioelectrochemistry for the characterization of living cells [114]. There is now growing interest in its application to a host of scientific problems.…”

Section: The Kelvin Methods For Electrostatic Potential Measurementsmentioning

confidence: 99%

Detection of charge distributions in insulator surfaces

Rezende¹,

Gouveia²,

Silva³

et al. 2009

J. Phys.: Condens. Matter

106

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Charge distribution in insulators has received considerable attention but still poses great scientific challenges, largely due to a current lack of firm knowledge about the nature and speciation of charges. Recent studies using analytical microscopies have shown that insulators contain domains with excess fixed ions forming various kinds of potential distribution patterns, which are also imaged by potential mapping using scanning electric probe microscopy. Results from the authors' laboratory show that solid insulators are seldom electroneutral, as opposed to a widespread current assumption. Excess charges can derive from a host of charging mechanisms: excess local ion concentration, radiochemical and tribochemical reactions added to the partition of hydroxonium and hydronium ions derived from atmospheric water. The last factor has been largely overlooked in the literature, but recent experimental evidence suggests that it plays a decisive role in insulator charging. Progress along this line is expected to help solve problems related to unwanted electrostatic discharges, while creating new possibilities for energy storage and handling as well as new electrostatic devices.

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Section: The Kelvin Methods For Electrostatic Potential Measurementsmentioning

confidence: 99%

Detection of charge distributions in insulator surfaces

Rezende¹,

Gouveia²,

Silva³

et al. 2009

J. Phys.: Condens. Matter

106

View full text Add to dashboard Cite

show abstract

“…[23][24][25][26] The systems based on Kelvin force scanning microscopy (KFM) or scanning electric potential microscopy (SEPM) are specially useful because of their 10 nm lateral resolution that is within the macromolecular or nanoparticle size range. [27][28][29] Most work using these techniques has been done on semiconductors or metals, 30,31 but they were also used to investigate the charge pattern imaged on thin film electrets 32 and nanopatterned surfaces. 33 The authors' laboratory has been using this technique for the examination of dielectric solids, especially colloid polymers or latexes, 34,35 in association with analytical electron microscopy (electron energy-loss spectroscopy in the transmission electron microscope, EELS-TEM), what allowed the unequivocal identification of polymer charge carriers with ionic constituents such as K + and RSO 4ions introduced during the polymerization process.…”

Section: Introductionmentioning

confidence: 99%

Water Vapor Adsorption Effect on Silica Surface Electrostatic Patterning

2008

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This work verifies a model for the creation and dissipation of reproducible electric potential patterns on silica surfaces, based on water adsorption, ionization, and ion migration under applied electric potential. Samples were thin silica films grown on silicon wafers and partially covered with sets of parallel gold stripe interdigitated electrodes that are normally used for Kelvin force microscope calibration. Noncontact electric potential measurements with a 20 nm spatial resolution were done using the Kelvin method under controlled atmosphere, in an atomic force microscope (AFM) with a Kelvin force attachment (KFM) mounted within an environmental chamber. Patterns were observed in micrographs acquired while one electrode set was biased and the other was grounded and when both were short-circuited and grounded. Electrostatic charging and discharging are much faster at high relative humidity, showing that the charged or discharged silica states are both changed faster under high humidity, while pattern preservation is effective under low humidity. The results are explained considering surface conductance and the partitioning of water cluster ions both in the solid−gas interfaces and the atmosphere, under the biased electrode potential.

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Modification of electrode materials for plasma torches

Cited by 2 publications

References 7 publications

Detection of charge distributions in insulator surfaces

Detection of charge distributions in insulator surfaces

Water Vapor Adsorption Effect on Silica Surface Electrostatic Patterning

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