Abstract:Influence of 30 kilo-electron-volt (keV) Argon (Ar + ) ions on optical and electrical properties of nickel nanowires (Ni-NWs) meshes is being reported. Ni-NWs are being exposed to 30 keV Argon (Ar + ) ions at various beam fluencies. These fluencies of Ar + ions are 7×10 14 ions cm −2 , 3×10 15 ions cm −2 and 3×10 16 ions cm −2 . After irradiation, Ni-NWs meshes were analyzed through transmission electron microscopy technique (TEM). The structural analysis has been done through X-ray diffraction technique… Show more
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