Modes of Propagating Light Waves in Thin Deposited Semiconductor Films

Tien, P. K.; Ulrich, R.; Martin, R. J.

doi:10.1063/1.1652820

Cited by 749 publications

(146 citation statements)

References 4 publications

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“…By combining the four identified TE-modes of the dark line spectrum, six mode couples can be formed; the results from the numerical calculations for the refractive index and the film thickness are shown in Table I for the different mode couples, respectively. The positions of the absorption peaks is in accordance with earlier publications [12,13], as compared to the results from ceramic bulk material [14], however, smaller values of the refractive index were obtained. The results obtained in our studies are also in relatively good accordance with the data from other PZT thin films elaborated by chemical solution deposition processes [15,16].…”

Section: Optical Characterization Of the Pzt Thin Filmssupporting

confidence: 81%

Wet Chemical Etching of Pb(ZrTi)O 3 Ferroelectric Thin Films for Optical Waveguide Application

Gundel¹,

Cardin²,

Averty³

et al. 2003

Ferroelectrics

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In order to develop optical waveguide structures using Pb(ZrTi)O 3 ferroelectric thin films, chemical solution deposition and spin-coating on glass substrates were studied. Classical photolithography and wet chemical etching method were applied for the realization of linear and Mach-Zehnder type waveguide structures, having a width of up to 100 "m and a irregularity of the border in the 1 "m region for an overall length of 20 mm. Optical characterization allows to qualify the ferroelectric material in terms of use for telecommunication applications, coupling of laser light by the M-lines technique allows to study light propagation and the related propagation losses.

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Section: Optical Characterization Of the Pzt Thin Filmssupporting

confidence: 81%

Wet Chemical Etching of Pb(ZrTi)O 3 Ferroelectric Thin Films for Optical Waveguide Application

Gundel¹,

Cardin²,

Averty³

et al. 2003

Ferroelectrics

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“…Coupling between external radiation and guided modes can be achieved principally by three means: end-fired waveguides, 24 frustrated total internal reflection from a prism across an air-gap, 25,26 and coupling by textured interfaces. 27,28 Only the last one is relevant to solar cells because it is applicable on large areas.…”

Section: Periodicity and Reciprocal Spacementioning

confidence: 99%

Resonances and absorption enhancement in thin film silicon solar cells with periodic interface texture

Haug

Söderström

Naqavi

et al. 2011

Journal of Applied Physics

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We study absorption enhancement by light scattering at periodically textured interfaces in thin film silicon solar cells. We show that the periodicity establishes resonant coupling to propagating waveguide modes. Ideally, such modes propagate in the high index silicon film where they are eventually absorbed, but waveguide modes exist also in the transparent front contact layer if the product of its refractive index and thickness exceeds half the wavelength. Taking into account that the absorption coefficient of realistic transparent conducing films exceeds the one of silicon close to its band gap, certain waveguide modes will enhance parasitic absorption in the transparent front contact. From an analysis based on the statistic distribution of energy among the available waveguide and radiation modes, we conclude that conventional thin film silicon solar cells with thick and nonideal contacts may fail to reach the previously noted bulk limit of 4n 2Si ; instead, a more conservative limit of 4 n 2 Si À n 2 TCO À Á applies.

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“…The information of the spectrum obtained by the incident angles less than the critical angle cannot be (or were not) utilized in both the waveguide and ATR techniques [3], [4]. However, the photoacoustic resonance absorption technique is specially suited to detect the weak signal, thus the measurement precision is improved, and the experimental arrangement is also simplified compared with the waveguide and ATR techniques, particularly when the thick films are measured without the hemicylinder coupler.…”

Section: C7-618 Journal De Physique IVmentioning

confidence: 99%

“…A number of techniques have been used to determine the thicknesses and refractive indexes of films, there are ellipsometry [l], reflectance spectroscopy [2], waveguide technique [3], and resonance ATR technique [4], etc.. In this paper we extend a new developed photoacoustic angular resonance spectroscopy [5], combining the hemicylinder-film coupling structure with the photoacoustic absorption measurement technique, to obtain the thicknesses and refractive indexes of thin films simultaneously.…”

mentioning

confidence: 99%