2017
DOI: 10.1155/2017/7513239
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Modelling Scattering of Electromagnetic Waves in Layered Media: An Up-to-Date Perspective

Abstract: This paper addresses the subject of electromagnetic wave scattering in layered media, thus covering the recent progress achieved with different approaches. Existing theories and models are analyzed, classified, and summarized on the basis of their characteristics. Emphasis is placed on both theoretical and practical application. Finally, patterns and trends in the current literature are identified and critically discussed.

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Cited by 20 publications
(9 citation statements)
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References 110 publications
(148 reference statements)
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“…More precisely, the backscattering coefficient at a certain point of the observed scene might be expressed in terms of the functional form σ 0 = σ 0 (χ l , m), where χ l is the LIA and m is the vector representing the (geometric and dielectric) local parameters of the surface or layered structure [40,41] (e.g., interfacial roughness, dielectric permittivity, vegetation cover, etc.). The m-dependence formally underlines the fact that σ 0 might be locally sensitive to the electromagnetic and geometric properties of the ground cover class.…”
Section: Resultsmentioning
confidence: 99%
“…More precisely, the backscattering coefficient at a certain point of the observed scene might be expressed in terms of the functional form σ 0 = σ 0 (χ l , m), where χ l is the LIA and m is the vector representing the (geometric and dielectric) local parameters of the surface or layered structure [40,41] (e.g., interfacial roughness, dielectric permittivity, vegetation cover, etc.). The m-dependence formally underlines the fact that σ 0 might be locally sensitive to the electromagnetic and geometric properties of the ground cover class.…”
Section: Resultsmentioning
confidence: 99%
“…The first-order SPM can be used if the rms-heights of rough surfaces are small compared to the incident wavelength and if the gradients of the surface heights are small compared to 1 [1,2]. The SSA has a wider validity domain of the SPM and bridges the gap between the SPM and the Kirchhoff Approximation.…”
Section: Direct Models For the Incoherent Intensitymentioning
confidence: 99%
“…Electromagnetic modeling is a valuable tool for radar data inversion to intend to characterize the geometrical and electrical properties of layered structures. The analytical models are based on physical approximations which reduce the applicability domain [1][2][3]. Within their domains of applicability, these models allow a fast analysis of the multilayered structures by means of analytical formulae.…”
Section: Introductionmentioning
confidence: 99%
“…The quantity 0 u designates the layer average thickness. The two boundaries are located at the height 1 i a x y are much smaller than 1 so that the perturbation method may be used to study wave scattering [6]- [8]. The cross-spectrum 12 ( , ) R  is given in the following form:…”
Section: Introductionmentioning
confidence: 99%