2020
DOI: 10.1107/s1600577519017235
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Modelling phase imperfections in compound refractive lenses

Abstract: A framework based on physical optics for simulating the effect of imperfect compound refractive lenses (CRLs) upon an X‐ray beam is described, taking into account measured phase errors obtained from at‐wavelength metrology. A CRL stack is modelled, with increasing complexity, as a single thin phase element, then as a more realistic compound element including absorption and thickness effects, and finally adding realistic optical imperfections to the CRL. Coherent and partially coherent simulations using Synchro… Show more

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Cited by 13 publications
(14 citation statements)
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“…Zernike polynomial fitting is a useful tool in diagnosing visible optics wave aberrations over a circular or annular aperture. Zernike polynomials expansion is used over the wavefront error map in quantifying optics aberrations present in X-ray optics (Celestre et al, 2020;Seiboth et al, 2016;Zhou et al, 2018). An imperfect optics produces blurred images of a source, and the performance improvement of optics by aberration compensation schemes can be expressed in terms of reduction in the coefficient of classical primary (Seidel) optics aberrations closely represented by low-order Zernike polynomials.…”
Section: Introductionmentioning
confidence: 99%
“…Zernike polynomial fitting is a useful tool in diagnosing visible optics wave aberrations over a circular or annular aperture. Zernike polynomials expansion is used over the wavefront error map in quantifying optics aberrations present in X-ray optics (Celestre et al, 2020;Seiboth et al, 2016;Zhou et al, 2018). An imperfect optics produces blurred images of a source, and the performance improvement of optics by aberration compensation schemes can be expressed in terms of reduction in the coefficient of classical primary (Seidel) optics aberrations closely represented by low-order Zernike polynomials.…”
Section: Introductionmentioning
confidence: 99%
“…However, by translating the phase plate along the optical axis by a certain distance, one can compensate these effects and the phase plate can correct over a broad energy range . Instead of measuring the wavefield for a specific lens combination, one can also pursue the approach to characterize the thickness profile of individual lens elements (Celestre et al, 2020). This allows to numerically calculate any lens stack from the measured single lenses at arbitrary photon energies and to retrieve the potential wavefront deformation of this lens configuration numerically.…”
Section: Refractive Phase Platesmentioning
confidence: 99%
“…6, the single lens model, accounts for the absorption (first exponential) and phase shift (second exponential) from a single X-ray lenslet. Stacked lenses can be simulated either by a single-lens-equivalent representation or by using multi-slice-like techniques, where the X-ray beam is propagated using free-space propagators in between the optical elements [ 15 ].…”
Section: The Ideal Crlmentioning
confidence: 99%
“…a model that could parametrise all sources of deviations from the parabolic shape. To circumvent that and to accurately model phase imperfection in compound refractive lenses, metrology data can also be used for optically imperfect X-ray lenses [ 15,35 ]. Fig.…”
Section: Metrology Datamentioning
confidence: 99%
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