2017
DOI: 10.1016/j.mssp.2016.10.048
|View full text |Cite
|
Sign up to set email alerts
|

Modelling doping design in nanowire tunnel-FETs based on group-IV semiconductors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2017
2017
2021
2021

Publication Types

Select...
4
1

Relationship

1
4

Authors

Journals

citations
Cited by 7 publications
(4 citation statements)
references
References 24 publications
(26 reference statements)
0
4
0
Order By: Relevance
“…Additionally, the bandgap of Ge 1– x Sn x nanowires with a high Sn narrows, resulting in high off-state leakage in a FET device which is difficult to control. 51 …”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…Additionally, the bandgap of Ge 1– x Sn x nanowires with a high Sn narrows, resulting in high off-state leakage in a FET device which is difficult to control. 51 …”
Section: Resultsmentioning
confidence: 99%
“…We did not generate any FET devices for Ge 1– x Sn x nanowires with very high Sn contents (>15 atom %), due to their structural instability (Figures S7 and S8 in the Supporting Information), which may also instigate possible deformation of the nanowire lattice under electrical bias. Additionally, the bandgap of Ge 1– x Sn x nanowires with a high Sn narrows, resulting in high off-state leakage in a FET device which is difficult to control …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…One intuitive method to suppress ambipolar behavior is to use a lightly doped drain. However, previous investigations didn't reveal expected results, especially for the ultrathin SOI and nanowire structure devices [19]- [21]. Another reported method is to use different materials for the source and drain.…”
Section: Introductionmentioning
confidence: 98%