1990
DOI: 10.1007/bf01901660
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Modelling and analysis of electromagnetic fields in 3D inhomogeneous media

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Cited by 19 publications
(5 citation statements)
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“…However, most EM software developers refrain from implementation of the IE approach, since accurate computation of the matrix A IE is indeed an extremely tedious and nontrivial problem itself. Yet this approach has been implemented in several studies (Ting and Hohmann, 1981;Wannamaker et al, 1984;Newman and Hohmann, 1988;Hohmann, 1988;Cerv, 1990;Wannamaker, 1991;Dmitriev and Nesmeyanova, 1992;Xiong, 1992;Xiong and Tripp, 1995;Kaufman and Eaton, 2001, among others).…”
Section: Integral Equation Approachmentioning
confidence: 96%
“…However, most EM software developers refrain from implementation of the IE approach, since accurate computation of the matrix A IE is indeed an extremely tedious and nontrivial problem itself. Yet this approach has been implemented in several studies (Ting and Hohmann, 1981;Wannamaker et al, 1984;Newman and Hohmann, 1988;Hohmann, 1988;Cerv, 1990;Wannamaker, 1991;Dmitriev and Nesmeyanova, 1992;Xiong, 1992;Xiong and Tripp, 1995;Kaufman and Eaton, 2001, among others).…”
Section: Integral Equation Approachmentioning
confidence: 96%
“…The relatively conductive region of the mantle (SE half) is assigned a resistivity of 500 m, whereas the resistive mantle region has a resistivity of 1000 m. The model is rotated clockwise by 45 • to accommodate straight mesh lines at an angle +45 • and −45 • , thereby avoiding edge effects of the rectangular mesh used for the finite difference (FD) modelling (e.g. Cerv & Pek 1990;Avdeev 2005;Börner 2010). MT responses are modelled for the period range 10 −3 -10 5 s at 144 stations arranged in a grid on top of the synthetic model as well as for 13 additional sites aligned along an approximately N-S oriented profile (cf.…”
Section: The Synthetic 3-d Modelmentioning
confidence: 99%
“…The conventional definition of 'pr,'given by Cagniard (1953), uses the magnitude of MT impedance. In a 2D or 3D inhomogeneous environment the apparent resistivity is frequently distorted by static shifts and other induction effects (Berdichevsky and Dimitriev 1976;Park 1985;Jones 1988;Cerv and Pek 1990, Jiracek 1990, Beamish and Travassos 1992, 1993. In spite of this t|r'e p7data are used directly in computer inversion schemes to determine the resistivity distribution, since the apparent resistivity pseudosection possesses no attribute characteristic in itself suitable for imaging lhe structure.…”
Section: Lntroduction Some Aspects Of the Selection Of Mt Parametermentioning
confidence: 99%