Modeling the Parasitic Resistances and Capacitances of Advanced Vertical Gate-All-Around Transistors

Peng, Baokang; Chen, Sihao; Li, Yu; Zhang, Lining; Wu, Heng; Li, Ming; Wang, Runsheng; Huang, Ru

doi:10.1109/ted.2023.3339080

IEEE Trans. Electron Devices

2024

DOI: 10.1109/ted.2023.3339080

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Modeling the Parasitic Resistances and Capacitances of Advanced Vertical Gate-All-Around Transistors

Baokang Peng,

Sihao Chen,

Yu Li

et al.

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Modeling the Parasitic Resistances and Capacitances of Advanced Vertical Gate-All-Around Transistors

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