2008
DOI: 10.1016/j.sse.2007.11.008
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Modeling the effects of the channel electron velocity on the channel surface potential of ballistic MOSFETs

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Cited by 7 publications
(2 citation statements)
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“…Such a phenomenon implies that the surface potential will decrease with the increase in channel electron velocity when the quantum coupling between the longitudinal and transverse components of channel electron motion has been considered. The details of the effects of quantum coupling on the surface potential and the gate leakage current have been reported in [9,10]. Table 1 shows the three initial energy eigenvalues after neglecting quantum coupling and after considering quantum coupling with different channel electron velocities for a ballistic MOSFET obtained by self-consistently solving the coupled Schrödinger-Poisson equations using the finite-difference method.…”
Section: Resultsmentioning
confidence: 99%
“…Such a phenomenon implies that the surface potential will decrease with the increase in channel electron velocity when the quantum coupling between the longitudinal and transverse components of channel electron motion has been considered. The details of the effects of quantum coupling on the surface potential and the gate leakage current have been reported in [9,10]. Table 1 shows the three initial energy eigenvalues after neglecting quantum coupling and after considering quantum coupling with different channel electron velocities for a ballistic MOSFET obtained by self-consistently solving the coupled Schrödinger-Poisson equations using the finite-difference method.…”
Section: Resultsmentioning
confidence: 99%
“…Hot carriers in organic semiconductor-based devices can reduce their effective activation energy [26]. Hot-carriers effects in silicon based-devices can reduce the barrier height [27], change its tunneling current [28], decrease its channel electron density [29], increase its gate leakage current [30], [31], change its surface potential [32], affect its capacitance [33], [34], be a physical origin of the ideality factor of Shockley diode current equation [35].…”
Section: Introductionmentioning
confidence: 99%