Modeling the effect of subsurface interface defects on contact stiffness for ultrasonic atomic force microscopy

Sarioglu, A. Fatih; Atalar, Abdullah; Degertekin, F. Levent

doi:10.1063/1.1764941

Cited by 50 publications

(31 citation statements)

References 12 publications

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“…Finally, HFM has been employed to detect NPs deeply buried in polymeric matrixes. 29 While the theoretical explanation of the nature of the subsurface contrast, whether it is due to ultrasonic wave scattering or elastic field modification, is still under discussion, 30 recent investigations have confirmed the reproducibility of this experimental observation. 31,32 Based on these premises, we have carried out a study of samples made of two-dimensional (2D) materials, 33 targeting the exploration of subsurface details by means of UFM.…”

Section: Introductionmentioning

confidence: 79%

Subsurface imaging of two-dimensional materials at the nanoscale

et al. 2017

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Scanning probe Microscopy (SPM) represents a powerful tool that, in the past thirty years, has allowed one to investigate material surfaces in unprecedented ways at the nanoscale level. However, SPM has shown very little power of depth penetration, whereas several nanotechnology applications would require it. Subsurface imaging has been achieved only in a few cases, when subsurface features influence the physical properties of the surface, such as the electronic states or the heat transfer. Ultrasonic Force Microscopy (UFM), an adaption of the Atomic Force Microscopy (AFM) contact mode, can dynamically measure the stiffness of the elastic contact between the probing tip and the sample surface. In particular, UFM has proven highly sensitive to the near-surface elastic field in non-homogeneous samples.In this paper, we present an investigation of two-dimensional (2D) materials, namely flakes of graphite and molybdenum disulphide placed on structured polymeric substrates.We show that UFM can non-destructively distinguish suspended and supported areas and localize defects, such as buckling or delamination of adjacent monolayers, generated by residual stress. Specifically, UFM can probe small variations in the local indentation induced by the mechanical interaction between tip and sample. Therefore, any change in the elastic modulus within the volume perturbed by the applied load or the flexural bending of the suspended areas can be detected and imaged. Such a power of investigation is very promising in order to investigate the buried interfaces of nanostructured 2D materials such as in graphene-based devices.

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Section: Introductionmentioning

confidence: 79%

Subsurface imaging of two-dimensional materials at the nanoscale

et al. 2017

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“…A-SPM techniques have indisputably demonstrated their capability for imaging subsurface features using ad hoc prepared samples [69,[111][112][113][114]. In particular, A-SPM quantitative measurements of contact stiffness have shown good agreement with theoretical calculations of reduced adhesion at buried interfaces [111,115] and of subsurface voids [112]. Apart from the admittedly amazing results attained on test samples, more theoretical and/or experimental efforts are required for the interpretation of subsurface imaging of real samples.…”

Section: Subsurface Imagingmentioning

confidence: 93%

Acoustic Scanning Probe Microscopy: An Overview

Passeri

Marinello

2012

Acoustic Scanning Probe Microscopy

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In this chapter, which serves as an introduction to the entire book, an overview is given of techniques resulting from the synergy between ultrasonic methods and scanning probe microscopy (SPM). Although other acoustic SPMs have been developed, those reviewed in this book are either the earliest proposed techniques, which are most widespread, extensively used, and continuously improved, or have been recently developed, but have been proved to be extremely promising. The techniques are briefly introduced, emphasizing what they have in common, their differences, their capabilities, and limitations.

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“…When optimized, this method gives the opportunity to image the defects in coatings in thickness of 100 nm [17] or more. The depth of defect detection depends on the applied force and the probing tip radius of curvature.…”

Section: Introductionmentioning

confidence: 99%

Use of Ultrasonic Force Microscopy to Image the Interior Nanoparticles in ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7-{\rm x}}$ Films

Varanasi

Nalladega

Sathish

et al. 2007

IEEE Trans. Appl. Supercond.

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Nanoparticles present in the interior of YBa 2 Cu 3 O 7 x (YBCO) films were successfully imaged for the first time by using an ultrasonic force microscope (UFM), which can also operate as a conventional atomic force microscope (AFM).Nanoparticles of Y 2 BaCuO 5 and BaSnO 3 were introduced into YBCO films using pulsed laser ablation to improve critical current density via enhanced flux pinning. The scanning speed and ultrasonic frequencies in the range of 300-500 kHz were optimized for each sample such that the nanometer sized particles on the surface as well as from the film interior can be imaged with good contrast and resolution. UFM and AFM scans taken of the same locations were compared to show the advantages of using UFM over AFM. We demonstrate that UFM can be used nondestructively to both characterize the interior nanoparticles introduced in YBCO films and provide high resolution images of the screw dislocation induced terraces present in the films.

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Modeling the effect of subsurface interface defects on contact stiffness for ultrasonic atomic force microscopy

Cited by 50 publications

References 12 publications

Subsurface imaging of two-dimensional materials at the nanoscale

Subsurface imaging of two-dimensional materials at the nanoscale

Acoustic Scanning Probe Microscopy: An Overview

Use of Ultrasonic Force Microscopy to Image the Interior Nanoparticles in ${\rm YBa}_{2}{\rm Cu}_{3}{\rm O}_{7-{\rm x}}$ Films

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